'Average gate width' diaporamas de présentation

Lithography Simulation-Based Full-Chip Design Analyses Presenter: Puneet Sharma (sharma@ucsd)

Device Analyses. a. b. < -8nm. -7nm, -6nm. -5nm, -4nm. -3nm, -2nm. +2nm, -3nm. Experiments & Results. +4nm, +5nm. +6nm, +7nm. SPICE Netlists. Library. Characterize. For LVS. Objective. Std. Cell GDS. Device Analyses. Objective-Specific Verilog. Drawn Layout (DEF).

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