'Delay fault detection' diaporamas de présentation

Delay Fault Simulation with Bounded Gate Delay Model

Delay Fault Simulation with Bounded Gate Delay Model. Soumitra Bose Design Technology, Intel Corp. Folsom, CA 95630 Hillary Grimes and Vishwani D. Agrawal Dept. of ECE, Auburn University Auburn, AL 36849. Purpose. Investigate min-max delay simulation used for process variation

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