'Gnd a b' diaporamas de présentation

EE 587 SoC Design & Test

EE 587 SoC Design & Test. Partha Pande School of EECS Washington State University pande@eecs.wsu.edu. SoC Physical Design Issues Wire Capacitance. I avg. v. t. Technology Scaling Effects. At 0.5um and above: Simple capacitance At 0.35um and below: Resistance

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