'Input change' diaporamas de présentation

CPRE 583 Reconfigurable Computing Lecture 2: 8/26/2011 (VHDL Overview 1 )

CPRE 583 Reconfigurable Computing Lecture 2: 8/26/2011 (VHDL Overview 1 ). Instructor: Dr. Phillip Jones (phjones@iastate.edu) Reconfigurable Computing Laboratory Iowa State University Ames, Iowa, USA. http://class.ece.iastate.edu/cpre583/. Overview. VHDL review 1

718 views • 60 slides

Fundamentals of Industrial Control WEEK 3

Fundamentals of Industrial Control WEEK 3. This week : Pressure Measurement Terminology Pressure Sensor Technology . How was it last Week?. Recap of last Week: Remember the terms? Types of Level sensors Did we miss any? Homework done?!. What are Sensors?. Sensors:

550 views • 39 slides

467 views • 37 slides

Asynchronous Sequential Circuits

Asynchronous Sequential Circuits . Definitions. Asynchronous circuits: within large synchronous systems, it is often desirable to allow certain subsystems to operate asynchronously to reduce delay and power consumption

1.88k views • 31 slides

Lecture 8 Memory Elements and Clocking

Lecture 8 Memory Elements and Clocking. Hai Zhou ECE 303 Advanced Digital Design Spring 2002. Outline. Sequential logic networks Latches (RS Latch) Flip-flops (D and JK) Timing issues (setup and hold times) READING: Katz 6.1, 6.2, 6.3, Dewey 8.1, 8.2. Sequential Switching Networks.

683 views • 25 slides

Lecture 20 Delay Test

Lecture 20 Delay Test. Delay test definition Circuit delays and event propagation Path-delay tests Non-robust test Robust test Five-valued logic and test generation Path-delay fault (PDF) and other fault models Test application methods Combinational, enhanced-scan and normal-scan

748 views • 25 slides

Parallel Input/Output Controller (PIO)

Parallel Input/Output Controller (PIO). Each I/O line of the PIO Controller features: An input change interrupt enabling level change detection on any I/O line. A glitch filter providing rejection of pulses lower than one-half of clock cycle.

332 views • 10 slides