'Mean time to failure' diaporamas de présentation

Cooperative cross-layer protection for resource constrained embedded systems

Cooperative cross-layer protection for resource constrained embedded systems. Prof. Nikil Dutt Prof. Nalini Venkatasubramanian Prof. Lichun Bao. Kyoungwoo Lee (topic exam). June 17, 2008. Contents. Motivation Cooperative, Cross-layer Methods PPC (Partially Protected Caches)

765 views • 63 slides

TinyOS: Concurrent Execution, and Power control

TinyOS: Concurrent Execution, and Power control. Class 9. Announcements. Sign up for the weeken d classes Review phase 1 requirements Each group update TA on your progress with TinyOS installation . Agenda. TinyOS multi-threading Radio duty cycling Power management in sensors.

624 views • 53 slides

MPD 575 Design for Reliability

MPD 575 Design for Reliability. Jonathan Weaver. DReliability Development History. Originally developed by MPD Cohort 3 team of Julie Earle, Dave Herczeg, and Jim Van Gilder in Fall 2002. Design for Reliability. Why Design for Reliability?.

1.08k views • 49 slides

CS 61C: Great Ideas in Computer Architecture Dependability

CS 61C: Great Ideas in Computer Architecture Dependability. Instructor: David A. Patterson http://inst.eecs.Berkeley.edu/~cs61c/sp12. Review. Name of the Game: Reduce Cache Misses 2 memory blocks mapping to same block knock each other out as program bounces from 1 memory location to next

553 views • 41 slides

CS533 Modeling and Performance Evaluation of Network and Computer Systems

CS533 Modeling and Performance Evaluation of Network and Computer Systems. Selection of Techniques and Metrics. (Chapter 3). Overview. One or more systems, real or hypothetical You want to evaluate their performance What technique do you choose? Analytic Modeling? Simulation? Measurement?.

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Electromigration Analysis for MTTF Calculations

Electromigration Analysis for MTTF Calculations. Mahesh N. Jagadeesan Analog IC Research Group The University of Texas, Arlington jmaheshn@yahoo.com. Electromigration. Current induced transport of the conducting material Electromigration is caused by high current density stress

1.11k views • 33 slides

Seagate ships billionth drive!

445 views • 33 slides

Performance Evaluation of Computer Systems Introduction

In the Name of the Most High . Performance Evaluation of Computer Systems Introduction. By Behzad Akbari Tarbiat Modares University Spring 2009. Outline. Introduction to performance evaluation Objectives of performance evaluation Techniques of performance evaluation

813 views • 33 slides

The Design and Architecture of the Microsoft Cluster Service (MSCS) - W. Vogels et al.

The Design and Architecture of the Microsoft Cluster Service (MSCS) - W. Vogels et al. ECE 845 Presentation By Sandeep Tamboli April 18, 2000. Outline. Prerequisites Introduction Design Goals Cluster Abstractions Cluster Operation Cluster Architecture Implementation Examples Summary.

476 views • 30 slides

Performance Evaluation of Computer Systems and Networks Introduction

In the Name of the Most High. Performance Evaluation of Computer Systems and Networks Introduction. By Behzad Akbari Tarbiat Modares University Spring 2012. Outline. Introduction to performance evaluation Objectives of performance evaluation Techniques of performance evaluation

563 views • 29 slides

Software Reliability

511 views • 24 slides

Saturation effect and the need for a new theory of software reliability

Saturation effect and the need for a new theory of software reliability Aditya P. Mathur Professor, Department of Computer Science, Associate Dean, Graduate Education and International Programs Purdue University

593 views • 23 slides

Single Event Upset An Embedded Tutorial

Single Event Upset An Embedded Tutorial. Fan Wang Vishwani D. Agrawal. Department of Electrical and Computer Engineering Auburn University, AL 36849 USA 21 th International Conf. on VLSI Design, Hyderabad, India, January 4-8, 2008. Motivation for This Work.

535 views • 22 slides

Single Event Upset An Embedded Tutorial

Single Event Upset An Embedded Tutorial. Fan Wang Vishwani D. Agrawal. Department of Electrical and Computer Engineering Auburn University, AL 36849 USA 21 th International Conf. on VLSI Design, Hyderabad, India, January 4-8, 2008. Motivation for This Work.

227 views • 22 slides

Single Event Upset An Embedded Tutorial

Single Event Upset An Embedded Tutorial. Fan Wang Vishwani D. Agrawal. Department of Electrical and Computer Engineering Auburn University, AL 36849 USA 21 th International Conf. on VLSI Design, Hyderabad, India, January 4-8, 2008. Motivation for This Work.

342 views • 22 slides

Introduction to Software Quality Assurance

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Lecture on Computer Science as a Discipline

634 views • 19 slides

Selective Replication : A Lightweight Technique for Soft Errors

Selective Replication : A Lightweight Technique for Soft Errors. Xavier Vera, Jaume Abella ,Javier Carretero and Antonio Gonzalez. Outline of Presentation. Introduction Soft Errors Selective Replication Technique Implementation of Selective Replication

291 views • 17 slides

Ch.5 Evaluation and Validation

Ch.5 Evaluation and Validation. 5.1 Introduction 5.2 Performance evaluation 5.3 Energy and power models 5.5 Thermal models 5.5 Risk- and dependability analysis 5.6 Simulation 5.7 Rapid prototyping and emulation 5.8 Formal Verification. 5.1 Introduction. 5.1.1 Scope

232 views • 10 slides

Student meeting 08.07.2013 MTTF calculations for the BLEDP card

175 views • 6 slides