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Measurements and Simulations of Surface Radiation Damage Effects on IFX and HPK Test Structures

Measurements and Simulations of Surface Radiation Damage Effects on IFX and HPK Test Structures. F. Moscatelli a,b , A. Morozzi b,c , D. Passeri b,c , S . Mattiazzo d , G.-F. Dalla Betta e,f , V. Hinger g and G. M. Bilei b. a CNR-IOM of Perugia, via Pascoli 1, 06123, Perugia, Italy

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VLSI Fabrication Technology

VLSI Fabrication Technology. 1. Figure A.1 Silicon ingot and wafer slices. Figure A.2 (a) An 8-pin plastic dual-in-line IC package, (b) A 16-pin surface mount package. (e) n + diffusion (mask #4). (a) Define n -well diffusion (mask #1). (f) p + diffusion (mask #5).

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1.27k views • 16 slides

VLSI Fabrication Technology

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