'Prob pass test high' diaporamas de présentation

VLSI Testing Lecture 1: Introduction

VLSI Testing Lecture 1: Introduction. Dr. Vishwani D. Agrawal James J. Danaher Professor of Electrical and Computer Engineering Auburn University, Alabama 36849, USA vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal IIT Delhi, Aug 17, 2013, 10:00-11:00AM. Course Description.

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Design for Testability Theory and Practice

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Lecture 1 Introduction

Lecture 1 Introduction. VLSI realization process Verification and test Ideal and real tests Costs of testing Roles of testing A modern VLSI device - system-on-a-chip Course outline Part I: Introduction to testing Part II: Test methods Part III: Design for testability.

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