'Si wafer' diaporamas de présentation

Neutron reflectometry

Neutron reflectometry. Helmut Fritzsche NRC-SIMS, Canadian Neutron Beam Centre, Chalk River, Canada. Application/advantages of neutron reflectometry Theoretical background Instrumental setup Experiments: Photoactive azobenzene films Hydrogen storage in MgAl films

682 views • 39 slides

Neutron reflectometry

Neutron reflectometry. Helmut Fritzsche NRC-SIMS, Canadian Neutron Beam Centre, Chalk River, Canada. Application/advantages of neutron reflectometry Theoretical background Instrumental setup Experiments: Photoactive azobenzene films Hydrogen storage in MgAl films

425 views • 39 slides

Low material budget microfabricated cooling devices for particle detectors

445 views • 31 slides

AXRO, DECEMBER 2009

X-ray Optics: Wolter versus KB system. Veronika Marsikova a , Libor Sveda b , Adolf Inneman a , Jiri Marsik a , Rene Hudec c , Ladislav Pina b a) Rigaku Innovative Technologies Europe, s.r.o. b) Czech Technical University in Prague, FNSPE

451 views • 30 slides

Process Flow : Overhead and Cross Section Views ( Diagrams courtesy of Mr. Bryant Colwill )

Process Flow : Overhead and Cross Section Views ( Diagrams courtesy of Mr. Bryant Colwill ). Step 1. Step 2. Step 3. Step 4. Step 5. Step 6. Step 7. Step 8. Step 9. Step 10. Step 12. Step 11. T. T. T. T. T. T. T. T. T. T. T. T. T. T. T. T. T. T. T. T. T. T. T.

306 views • 15 slides

On Wafer Ion Flux Sensors

On Wafer Ion Flux Sensors. SFR Workshop May 24, 2001 Berkeley, CA Tae Won Kim, Saurabh Ullal, and Eray S Aydil University of California Santa Barbara. 2001 GOAL: Build and demonstrate Langmuir probe based on wafer ion flux probe array using external electronics by 9/30/2001.

205 views • 9 slides

Neelkanth G. Dhere and Anil Pai

Development of Tribological Coatings for Cryocoolers T ask III. 4 Hydrogen Storage for Spaceport and Vehicle Applications. Neelkanth G. Dhere and Anil Pai. Titanium Nitride (TiN) Coatings.

165 views • 7 slides

eLiNE beam parameters

eLiNE beam parameters. All parameters were measured on a conducting Si wafer with Pt pattern using 10 m m aperture and 7 mm working distance (Z=26 mm),. .

113 views • 1 slides