'Single stuck' diaporamas de présentation

451 views • 45 slides

TSS@ETS10 Fault Models, Fault Simulation and Test Generation

TSS@ETS10 Fault Models, Fault Simulation and Test Generation. Vishwani D. Agrawal Department of ECE, Auburn University Auburn, AL 36849, USA www.ece.auburn.edu/~vagrawal vagrawal@eng.auburn.edu Prague, May 22, 2010, 2:30-6:30PM. Fault Modeling. Why model faults?

234 views • 23 slides

Lecture 5 Fault Modeling

Lecture 5 Fault Modeling. Why model faults? Some real defects in VLSI and PCB Common fault models Stuck-at faults Single stuck-at faults Fault equivalence Fault dominance and checkpoint theorem Classes of stuck-at faults and multiple faults Transistor faults Summary Review exercise.

252 views • 22 slides

VLSI Testing Lecture 3: Fault Modeling

VLSI Testing Lecture 3: Fault Modeling. Dr. Vishwani D. Agrawal James J. Danaher Professor of Electrical and Computer Engineering Auburn University, Alabama 36849, USA vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal IIT Delhi, July 25, 2012, 3:00-4:00PM. Contents.

255 views • 22 slides

VLSI Testing Lecture 3a: Fault Modeling

VLSI Testing Lecture 3a: Fault Modeling. Why model faults? Some real defects in VLSI and PCB Common fault models Stuck-at faults Single stuck-at faults Fault equivalence Fault dominance and checkpoint theorem Classes of stuck-at faults and multiple faults Transistor faults Summary.

212 views • 21 slides

Design for Testability Theory and Practice Lecture 3: Fault Modeling

Design for Testability Theory and Practice Lecture 3: Fault Modeling. Why model faults? Some real defects in VLSI and PCB Common fault models Stuck-at faults Single stuck-at faults Fault equivalence Fault dominance and checkpoint theorem Classes of stuck-at faults and multiple faults

219 views • 21 slides

MultiCore ATPG

MultiCore ATPG. 2010 IC/CAD Contest. ??????????. Goal.

217 views • 13 slides