'Vlsi chip yield' diaporamas de présentation

390 views • 38 slides

CSCE 932, Spring 2007

CSCE 932, Spring 2007. Yield Analysis and Product Quality. Yield Analysis & Product Quality. Yield, defect level, and manufacturing cost Clustered defects and yield model Test data analysis Example: SEMATECH chip Summary. ALL CHIPS. Test. (Tester Yield). FAIL. PASS. Bad. Good.

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VLSI Testing Lecture 2: Yield & Quality

VLSI Testing Lecture 2: Yield & Quality. Dr. Vishwani D. Agrawal James J. Danaher Professor of Electrical and Computer Engineering Auburn University, Alabama 36849, USA vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal IIT Delhi, July 24, 2012, 4:00-5:00PM. Contents.

196 views • 19 slides

VLSI Testing Lecture 2: Yield & Quality

VLSI Testing Lecture 2: Yield & Quality. Yield and manufacturing cost Clustered defect yield formula Defect level Test data analysis Example: SEMATECH chip Summary Problems to solve. VLSI Chip Yield.

513 views • 18 slides

VLSI Testing Lecture 2: Yield & Quality

VLSI Testing Lecture 2: Yield & Quality. Yield and manufacturing cost Clustered defect yield formula Defect level Test data analysis Example: SEMATECH chip Summary Problems to solve. VLSI Chip Yield.

191 views • 18 slides