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复 习 What did I learn in school today?

复 习 What did I learn in school today?. Major concept areas. Crystal structure and properties Crystallography Reciprocal lattice X-rays, X-ray spectra X-ray absorption, X-ray fluorescence Diffraction, Braggs' law, Ewald construction Powder diffractometer Powder patterns Indexing

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复 习 What did I learn in school today?

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  1. 复习 What did I learn in school today?

  2. Major concept areas Crystal structure and properties Crystallography Reciprocal lattice X-rays, X-ray spectra X-ray absorption, X-ray fluorescence Diffraction, Braggs' law, Ewald construction Powder diffractometer Powder patterns Indexing Intensities Powder pattern applications Qualitative analysis Quant analysis Crystallite size, microstrian Residual stress Thin film epitaxy SEM TEM, imaging and diffraction AFM

  3. Must-know terms Crystallography symmetry operation - translation, rotation lattice, Bravais lattice unit cell crystal system point group, space group stereographic projection equipoint lattice plane, lattice direction

  4. Must-know terms X-rays continuous radiation characteristic radiation synchrotron radiation mass attenuation coefficient absorption edge fluorescence

  5. Must-know terms Diffraction Braggs' law reciprocal lattice Ewald construction Debye rings

  6. Must-know terms Powder diffractometer focusing Soller slit divergence slit receiving slit monochromator detector deadtime

  7. Must-know terms Powder diffraction patterns indexing extinction rule atomic scattering factor structure factor intensity multiplicity Lorentz polarization temperature factor peak breadth

  8. Must-know terms Powder diffraction procedures diffractometer alignment calibration standards specimen displacement preferred orientation front fill, back fill, side drift zero background plate step size dwell time

  9. Must-know terms Powder diffraction applications PDF Hanawalt search method quantitative analysis crystallite size microstrain Scherrer equation Williamson-Hall method residual stress four-circle diffractometer epitaxy

  10. Must-know terms SEM microstructure matrix and precipitates backscattered electrons composition contrast secondary electrons topographic contrast depth of focus Wehnelt cup tunneling and field emission interaction volume

  11. Must-know terms TEM back focal plane jet thinning ion milling camera constant relrods

  12. Must-know terms AFM contact and non-contact modes constant height constant force tapping mode force-distance plot

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