1 / 13

Update on thin vs thick micro-strip detector studies

Update on thin vs thick micro-strip detector studies. G. Casse, P. Dervan, D. Forshaw, A. Greenall , I. Tsurin , T. Huse , . CONTEXT:.

zayit
Télécharger la présentation

Update on thin vs thick micro-strip detector studies

An Image/Link below is provided (as is) to download presentation Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author. Content is provided to you AS IS for your information and personal use only. Download presentation by click this link. While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server. During download, if you can't get a presentation, the file might be deleted by the publisher.

E N D

Presentation Transcript

  1. Update on thin vs thick micro-strip detector studies G. Casse, P. Dervan, D. Forshaw, A. Greenall, I. Tsurin, T. Huse, G. Casse,20th RD50 Workshop, Bari 31/05-02/06 2012

  2. CONTEXT: The choice of thin silicon sensors seems to meet the requirements for lowering the material budget of the vertex detectors, providing at the same time accrued radiation hardness (at very high doses). But, how thin can they be? This certainly depends on the application and the characteristics of the detector system. Microstrip detectors are not the configuration where reduced thickness can be pushed to the lower limits. Nonetheless studying the radiation hardness properties of thin microstrip sensors gives valuable indication on the change of their properties. We show here the CC(V) measurements of 100, 140 and 300 mm thick after irradiation to doses of 2E16 neq cm-2. Irradiation with reactor neutrons performed at the JSI reactor, usual thanks to V. Cindro et al. G. Casse,20th RD50 Workshop, Bari 31/05-02/06 2012

  3. 300µm Degradation of the CC(V) with neutron fluence for the 300mm thick sensors. G. Casse,20th RD50 Workshop, Bari 31/05-02/06 2012

  4. 140µm Degradation of the CC(V) with neutron fluence for the 140mm thick sensors. Likely mislabelling of one sensor, it looks like the irradiation dose of 5E15 neqcm-2 is missing. G. Casse,20th RD50 Workshop, Bari 31/05-02/06 2012

  5. 100µm Degradation of the CC(V) with neutron fluence for the 100mm thick sensors. Likely mislabelling of one sensor, it looks like the irradiation dose of 5E15 neqcm-2 is missing. G. Casse,20th RD50 Workshop, Bari 31/05-02/06 2012

  6. 2x1015neq cm-2 Comparison of the CC(V) after this dose for the 100, 140 and 300mm thick sensors. Collected charge similar at low voltages. G. Casse,20th RD50 Workshop, Bari 31/05-02/06 2012

  7. 1x1016neq cm-2 Comparison of the CC(V) after this dose for the 100, 140 and 300mm thick sensors. Thinner sensor exhibit better collected charge at same applied bias voltage. G. Casse,20th RD50 Workshop, Bari 31/05-02/06 2012

  8. 2x1016neq cm-2 Comparison of the CC(V) after this dose for the 100, 140 and 300mm thick sensors. Thinner sensor exhibit better collected charge at same applied bias voltage. G. Casse,20th RD50 Workshop, Bari 31/05-02/06 2012

  9. Degradation 300µm G. Casse,20th RD50 Workshop, Bari 31/05-02/06 2012

  10. Degradation 140µm CC(V) G. Casse,20th RD50 Workshop, Bari 31/05-02/06 2012

  11. Degradation 100µm CC(V) G. Casse,20th RD50 Workshop, Bari 31/05-02/06 2012

  12. Degradation all thicknesses 600 V 1000 V G. Casse,20th RD50 Workshop, Bari 31/05-02/06 2012

  13. CONCLUSIONS Thin sensors deliver higher charge collection than standard (300mm) silicon sensors after about 2E15 neq cm-2. The thinnest 100mm sensors also show an advantage towards the 140mm thick after the highest dose (2E15 neq cm-2). We tried 50mm thick devices but the signal is hardly resolvable from the noise tail with microstrip electronics. We would like to explore the effect of proton irradiation and of higher doses. It is also possible that 75mm thick devices can be usable with pour readout systems (typically Alibava, sct128...). G. Casse,20th RD50 Workshop, Bari 31/05-02/06 2012

More Related