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Multitest MT 9510 XP Handler

The Multitest MTu202f9510 XP is a triu2011temp picku2011andu2011place IC test handler designed for automated final testing of a wide range of semiconductor packages (e.g., QFP, BGA, QFN, CSP), supporting 8u201316 parallel test sites under temperatures from u201355u202fu00b0C to 175u202fu00b0C. It delivers high throughput (up to ~5,300u202funits/hour @ 0.38u202fs index time), features a compact footprint, quick package changeover, advanced ESD protection, and onboard data analytics & preventiveu2011maintenance tracking for reliable, high-volume manufacturing.

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Multitest MT 9510 XP Handler

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