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A burn-in test system is a specialized piece of equipment used in the semiconductor manufacturing process to assess the reliability and durability of integrated circuits (ICs) and other semiconductor devices.<br>During a burn-in test, these devices are subjected to extreme operating conditions, such as high temperatures, elevated voltages, and continuous operation, for an extended period. This stress testing helps to identify potential defects or weaknesses that might not surface under normal operating conditions.<br> <br> <br>
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