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This report details the scanning of samples related to CS distortion analysis conducted at CERN in September 2006, following a refresh in July. The study examines various parameters including scanning conditions, angle acceptance, and the characteristics of multiple films installed and exposed at 10 GeV π. Highlights of the findings include localized distortions exceeding 50 mrad, while global distortion remained minimal—less than 10 mrad for three films. The conditions of the scan room, including temperature and humidity, were carefully controlled to ensure accuracy.
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CS Distortion Kazuyama Yoshioka
Scanning Samples • Realistic CS film x 10 • 2nd refresh from ’06 July • (include Aug. run TTCS) • Some are installed to wall • Exposed 10 GeV π • Exposed & Developed in CERN in ’06 Sep.
Scanning Condition • Scanning Machine • UTS stage1 and stage2 • Angle acceptance : ±400mrad • PH cut : 7 • Scan room condition • Temp. 25℃ Humi. 40~45% • Emulsion thickness • 43.5~47.5μm (by manual)
Scanning Area y <Scan Area> 12mm x 9mm = 108 mm2 <Scan Area center> (x,y) = (60mm,50mm) 9mm 12mm x (0,0)
Base Track parameter • Angle Acceptance • Angle Difference< 100mrad • |(micro track angle) – (base track angle)|<100mrad • PH cut • PH Sum. > 20 • Sum. of 2 surface of 1 film.
Summary • Global Distortion • No Big Global Distortion • Over 10mrad … 3film • Local Distortion • Some point have big distortion (50mrad~) • 1 is scar • Future • SUTS 大面積… + Other Sample…