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IEEE P1581 Fringe meeting 26-10-2004 agenda

IEEE P1581 Fringe meeting 26-10-2004 agenda. Current status New input (Bob Russell) Follow up. IEEE P1581: Status. Draft overview: Draft 1.3 : at ITC2003 decided to finish draft as is and go for ballot (voted). Draft 1.4 textual update only (Sent for check up by KP)

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IEEE P1581 Fringe meeting 26-10-2004 agenda

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  1. IEEE P1581Fringe meeting 26-10-2004 agenda • Current status • New input (Bob Russell) • Follow up

  2. IEEE P1581: Status • Draft overview: • Draft 1.3: at ITC2003 decided to finish draft as is and go for ballot (voted). • Draft 1.4 textual update only (Sent for check up by KP) • Draft 1.5 on website, reflector mail (30-06-’04) • Draft 1.6 added IEEE std formats. Sent for IEEE editorial review. • Draft 1.7 update with editorial comments updated. On website, email reflector (18-10-’04) -Ready for ballot-

  3. IEEE P1581: Status • Procedural: • at ITC2003 decided to finish draft as is and go for ballot • Now, ballot is ready to start • Last minute technical changes should not interfere with our previous decision for ballot Basic course of action: 1. Proceed with ballot and finish P1581. 2. New technical issues to be solved in updates of P1581.

  4. IEEE P1581: technical • Power up test mode (Bob Russell) • Discussion • Wait for ballot? • Make a dedicated test pin optional? • What ‘WE cycle’ is general enough? • Quick insertion prior to ballot possible?

  5. IEEE P1581: technical • Con • Timing issues between power up and EXTEST • Care should be taken in driving test values to a few specific pins. • Reentry not possible without power down • Pro: • new test mode overcomes the extra test pin • The test mode is transparent for non users An earlier test mode descriptions was like this one Also transparent and no pin but failed on the mentioned cons => WG decided to go for test pin approach.

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