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2008 年 3 月 18 日

2011 年春季 HT-7 实验运行报告 ( NO20110422) HT-7 实验运行组 2010-04-22. 2008 年 3 月 18 日. 实验内容. 8:00-13:00 电流引线降温 9:00-11:00 LHCD 调试 / 出气 9:00 真空室烘烤降至壁温 120C 13:30 纵场励磁至 3800A 13:00-15:00 总控与各系统测试 15:00 等离子体放电调试. 等离子体启动调试. Vc~2000V,IT~3800A,Pvv~1.2 e-5Pa 击穿延时较大 , 壁温 ~ 120 ℃, 密度较高. 程序放电调试.

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2008 年 3 月 18 日

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  1. 2011年春季HT-7实验运行报告 (NO20110422) HT-7实验运行组 2010-04-22 2008年3月18日

  2. 实验内容 • 8:00-13:00 电流引线降温 • 9:00-11:00 LHCD调试/出气 • 9:00 真空室烘烤降至壁温120C • 13:30 纵场励磁至3800A • 13:00-15:00 总控与各系统测试 • 15:00 等离子体放电调试

  3. 等离子体启动调试 Vc~2000V,IT~3800A,Pvv~1.2e-5Pa击穿延时较大,壁温~120 ℃,密度较高

  4. 程序放电调试 Ip~100kA,200ms,Ne~2.8

  5. 垂直位移反馈控制调试 水平场反馈控制>>>Gp ⅹ(-1) 水平场程序控制

  6. 重复放电 Ip~100kA,Vp~2.3,Ne~2.0

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