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This study examines boosting min-cut placement to enhance signal delay in VLSI design. Learn how boosting can prevent global interconnects, the impact on wirelength values, and experimental findings. Gain insights on controlling wirelength distribution and optimizing cut values for efficient chip design.
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Boosting: Min-Cut Placement with Improved Signal Delay Andrew B. Kahng Igor L. Markov Sherief Reda CSE & ECE Departments University of CA, San Diego La Jolla, CA 92093 abk@cs.ucsd.edu EECS Department University of Michigan Ann Arbor, MI 48109 imarkov@eecs.umich.edu CSE Department University of CA, San Diego La Jolla, CA 92093 sreda@cs.ucsd.edu VLSI CAD Laboratory at UCSD
Outline • Introduction and motivation • Controlling wirelength distribution • Boosting min-cut placement • Effect of boosting on cut values • Experimental results • Conclusions
Introduction: Min-Cut Placement • Min-cut objective: minimize cut partitions → minimizes total wirelength with the help of terminal propagation • Min-cut partitioning produces slicing outlines
Introduction: Min-Cut Placement • Min-cut objective: minimize cut partitions → minimizes total wirelength with the help of terminal propagation • Min-cut partitioning produces slicing outlines
Motivation: Avoiding Global Interconnects • Min-cut placers • Sequentially minimize wirelength, i.e., the routing demand • Do not treat global interconnects in any special way • Global interconnects can severely increase propagation delay since delay is proportional to square of the wirelength take part of critical paths and degrade performance require buffering for electrical sanity have a propagation delay that is equivalent to several clock cycles Conclusion: try to prevent global interconnects
Motivation: Example Case A Case B • Cases A and B: same wirelength & number of cuts • CaseB: no global interconnects (cf. CaseA)
Outline • Introduction and motivation • Controlling wirelength distribution • Boosting min-cut placement • Effect of boosting on cut values • Experimental results • Conclusions
Bounds on Net Length • A net’s HPWL (Half Perimeter Wirelength) is bounded • from below by distances between closest points of incident partitions • from above by distances between furthest points of incident partitions • These bounds are gradually refined during top-down placement • at the beginning lower bounds are ~0s, upper bounds are determined by placement region • at the end, the bounds are close to (or match) HPWL Net L Upper bound = ¾ chip width Lower bound = ¼ chip width
Net L Upper bound reduces; lower bound stays the same Net L Upper bound stays the same; lower bound increases Dichotomy of Lower and Upper bounds Net L
Net Extension Control • Partitioning a block extends a net L if the next two equivalent conditions occur: (1) Cutting L increases the lower bound on its length Or equivalently (2) Not cutting L decreases the upper bound on its length • We use the previous conditions to detect net extension and attempt to curb it via boosting
Boost net L with a boosting factor of 2 L Boosting Min-Cut Placement • Boosting = multiplying a hyperedge (net) weight by a factor • boosting factor • Boosting is used only when a cut can increase a lower bound L
BOOST? BOOST? BOOST? BOOST? To Boost or Not to Boost? YES NO YES NO
Effect of Boosting on Cut Value Case 1 v u • v is connected to a net eligible for boosting, u is not • either can be moved to the right • Boosting factor is 2: the gain of v grows from 1 to 2 • Tie is broken by moving v → no degradation in wirelength, and a global wire is avoided
Effect of Boosting on Cut Value Case 2 v u • v is connected to several nets eligible for boosting, u is not • Boosting factor is 2 on each net: v’s gain grows from 3 to 6 • v has a higher priority → no degradation in wirelength and a global interconnect is eliminated
Effect of Boosting on Cut Value Case 3 v u • v is connected to 2 nets eligible for boosting • Boosting factor is 2 • gain for v increases (from 2 to 4); gain for u is the same (3) • v is moved → wirelength is degraded but global wires are prevented
Summary • Boosting helps in eliminating global interconnects • Boosting may degrade wirelength in some cases • To reduce wirelength degradation, we only boost during first 8 levels • That is where long wires are determined anyway • At the 8th placement level: → The average block perimeter is 1/256 of the original chip perimeter → Global interconnects are already established → No point in further boosting
Outline • Introduction and motivation • Controlling wirelength distribution • Boosting min-cut placement • Effect of boosting on cut values • Experimental results • Conclusions
Experimental Setup • Three industrial benchmarks • Two experiments: • Effect of boosting on the wirelength distribution • Effect of boosting on timing
Experimental Results: Wirelength Histogram (Design A) Percentage change in number of nets (%) Bins (in terms of half the chip’s perimeter) Boosting substantially reduces global interconnects
Experimental Results: Wirelength Histogram (Design B) Percentage change in number of nets (%) Bins (in terms of half the chip’s perimeter) Boosting substantially reduces global interconnects
Conclusions and Future work • By tracking lower/upper bounds, we identify potential long wires • By additionally increasing net weights, we decrease # of long wires • This alters wirelength distribution and reduces global interconnects • Routability is slightly affected, but generally preserved • Boosting tends to improve circuit delay (timing) measured by the worst slack and total negative slack (TNS) • Ongoing work examines the impact of boosting on the number of inserted buffers