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Yield Editor 2.0 yield maps made easy

Yield Editor 2.0 yield maps made easy. Ken Sudduth, Scott Drummond, and Brent Myers USDA-ARS Cropping Systems and Water Quality Research Unit Columbia, MO.

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Yield Editor 2.0 yield maps made easy

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  1. Yield Editor 2.0yield maps made easy Ken Sudduth, Scott Drummond, and Brent Myers USDA-ARS Cropping Systems and Water Quality Research Unit Columbia, MO Translating Missouri USDA-ARS Research and Technology into Practice A training session provided by USDA-ARS-CSWQRU, 10-11 October 2012, Columbia, MO

  2. From Sensors to Yield Maps Translating Missouri USDA-ARS Research and Technology into Practice A training session provided by USDA-ARS-CSWQRU, 10-11 October 2012, Columbia, MO

  3. Why clean yield data? • Yield data ALWAYS contain problems • Operational problems • Data collection errors • Calibration issues • Sensor system related problems • Sensor failure, noise, accuracy issues • Timing/filtering issues for individual sensors • Multiple sensors can magnify problems Translating Missouri USDA-ARS Research and Technology into Practice A training session provided by USDA-ARS-CSWQRU, 10-11 October 2012, Columbia, MO

  4. Basic yield calculation Translating Missouri USDA-ARS Research and Technology into Practice A training session provided by USDA-ARS-CSWQRU, 10-11 October 2012, Columbia, MO where k is used to account for unit conversion factors, and MC is a moisture correction factor based upon a crop specific market reference.

  5. Rapid change in velocity Translating Missouri USDA-ARS Research and Technology into Practice A training session provided by USDA-ARS-CSWQRU, 10-11 October 2012, Columbia, MO

  6. Unknown swath width Translating Missouri USDA-ARS Research and Technology into Practice A training session provided by USDA-ARS-CSWQRU, 10-11 October 2012, Columbia, MO

  7. Yield calculation with latency Translating Missouri USDA-ARS Research and Technology into Practice A training session provided by USDA-ARS-CSWQRU, 10-11 October 2012, Columbia, MO where i = time for grain to reach moisture sensor j = time for grain to reach grain flow sensor

  8. Incorrect delay time(s) Translating Missouri USDA-ARS Research and Technology into Practice A training session provided by USDA-ARS-CSWQRU, 10-11 October 2012, Columbia, MO

  9. Ramping at crop edge No edge treatment Edge cleaned Translating Missouri USDA-ARS Research and Technology into Practice A training session provided by USDA-ARS-CSWQRU, 10-11 October 2012, Columbia, MO

  10. Ramping at crop edge Kriged No edge treatment Kriged Edge cleaned Difference (bu/ac) Mean = 106.4 STD = 32.3 Mean = 108.1 STD = 31.7 >10% affected by more than 5 bu/ac Translating Missouri USDA-ARS Research and Technology into Practice A training session provided by USDA-ARS-CSWQRU, 10-11 October 2012, Columbia, MO

  11. Dealing with yield map errors Translating Missouri USDA-ARS Research and Technology into Practice A training session provided by USDA-ARS-CSWQRU, 10-11 October 2012, Columbia, MO All yield maps contain some errors that should be removed before analysis Manufacturers’ software does a good job of dealing with many simpler problems They have a tougher time with “trial-and-error” type settings (i.e. delay time – set, view, adjust) Manual editing (point, transect, area, etc.) must be done elsewhere (generally in a GIS) A software package was needed that provided all of these tools in one place

  12. Yield Editorversion 1.0, developed 2003 Translating Missouri USDA-ARS Research and Technology into Practice A training session provided by USDA-ARS-CSWQRU, 10-11 October 2012, Columbia, MO Yield Editor has been widely used by farmers, students, researchers, consultants, and others Total downloads of the software are now well over 3000

  13. Translating Missouri USDA-ARS Research and Technology into Practice A training session provided by USDA-ARS-CSWQRU, 10-11 October 2012, Columbia, MO

  14. YieldEditorversion 2.0 Translating Missouri USDA-ARS Research and Technology into Practice A training session provided by USDA-ARS-CSWQRU, 10-11 October 2012, Columbia, MO • In 2010 we began developing a new version of Yield Editor that would automate more of the yield data cleaning process • Delay time • Overlapped travel at end rows and partial swaths • Unrealistic point yield values • “Smart” thresholds for other filtering parameters • Batch mode operation

  15. YieldEditorversion 2.0 Translating Missouri USDA-ARS Research and Technology into Practice A training session provided by USDA-ARS-CSWQRU, 10-11 October 2012, Columbia, MO

  16. Automated yield cleaning expert (AYCE) Translating Missouri USDA-ARS Research and Technology into Practice A training session provided by USDA-ARS-CSWQRU, 10-11 October 2012, Columbia, MO

  17. Delay time determination Using relative spatial consistency Lee, D. H., K. A. Sudduth, S. T. Drummond, S. O. Chung, and D. B. Myers. 2012. Automated yield map delay identification using phase correlation methodology. Trans. ASABE 55(3): 743-752. Translating Missouri USDA-ARS Research and Technology into Practice A training session provided by USDA-ARS-CSWQRU, 10-11 October 2012, Columbia, MO

  18. Han’s bitmap overlap filter Han, S., S.M. Schneider, S.L. Rawlins, and R.G. Evans. 1997. A bitmap method for determining effective combine cut width in yield mapping. Trans. ASAE 40(2): 485-490. Translating Missouri USDA-ARS Research and Technology into Practice A training session provided by USDA-ARS-CSWQRU, 10-11 October 2012, Columbia, MO

  19. Localized standard deviation filter Translating Missouri USDA-ARS Research and Technology into Practice A training session provided by USDA-ARS-CSWQRU, 10-11 October 2012, Columbia, MO

  20. Summary Translating Missouri USDA-ARS Research and Technology into Practice A training session provided by USDA-ARS-CSWQRU, 10-11 October 2012, Columbia, MO The new Yield Editor 2.0 automates many common yield cleaning tasks Features from Yield Editor 1.0 are all still available, in addition to a host of new automated features Currently available for web download – just do a web search for “Yield Editor 2” We encourage interested users to try it and give us feedback

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