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Instrumentation systems

Instrumentation systems. Long slit geometry Kratky camera Bonse-Hart setup Others Simple pinhole camera Huxley Holmes camera Franks setup NanoSTAR with G öbel mirrors + many others. Instrumentation systems. Long slit geometry. Instrumentation systems. Long slit geometry.

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Instrumentation systems

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  1. Instrumentation systems Long slit geometry Kratky camera Bonse-Hart setup Others Simple pinhole camera Huxley Holmes camera Franks setup NanoSTAR with Göbel mirrors + many others

  2. Instrumentation systems Long slit geometry

  3. Instrumentation systems Long slit geometry long slit pinhole constant q contours

  4. Instrumentation systems long slit pinhole q distributions

  5. Instrumentation systems Kratky instrument incident beam slit system

  6. Instrumentation systems Kratky instrument incident beam slit system

  7. Instrumentation systems Kratky instrument incident beam slit system q range to 0.003 Å-1 sealed tube 107-108 ph/s non-oriented oriented sample - or perfectly oriented

  8. Instrumentation systems Slit smearing wλ(qλ)

  9. Instrumentation systems Slit smearing is desired cross section

  10. Instrumentation systems Slit desmearing (Read Roe, Section 5.6) Measure slit-length weighting fcn w/ no specimen or beam stop Calculate this fcn from slit geometry - then invert relationship betwn measured smeared data and unsmeared results (desired) Don't desmear - use infinite slit approx.

  11. Instrumentation systems Slit desmearing

  12. Instrumentation systems • SAXSess • Improved Kratky camera • Rotating anode + Göbel mirrors • ––> 1010 ph/s • Monochromatic beam • Short acquisition times • (deadtime effects) • Image plate detector • ≤0.1 mm resolution

  13. Instrumentation systems • Göbel mirrors • Si-W multi-layers on parabolic substrate • Multilayer spacing varies w/ position - • divergent beam comes out parallel • Length - about 5 cm - Bragg angle a few degrees

  14. Instrumentation systems • Simple pinhole camera • Lower flux - use 2D detector • qmin=0.01-0.005 Å-1� at lab sources • qmin=0.001 Å-1 at synchrotron sources • Any specimen configuration

  15. Instrumentation systems Huxley-Holmes SAXS EMBL Hamburg, bending magnet,100 mA - 1012 ph/sec Rotating anode - 107 ph/sec 2 mm x 5 mm specimen 10 meters 1 meter

  16. Instrumentation systems Bruker/Paar SAXS

  17. Instrumentation systems Bruker NanoSTAR SAXS

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