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Beam Micro-Structure Monitor

Beam Micro-Structure Monitor. T.Takahashi Hadron K1.8 Exp. Group. Micro-Structure Monitor. Scaler. w=40ns. C1. S1, S2 は、 BH1 の 隣り合わない Segment から選ぶ. S1. S1. C2. DL=600ns. S2. GDG. S2. C3. GDG. DL=5.6us. F.T. timing signal. Spill Gate Generator. delay 0.3s w=2.0s.

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Beam Micro-Structure Monitor

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  1. Beam Micro-Structure Monitor T.Takahashi Hadron K1.8 Exp. Group

  2. Micro-Structure Monitor Scaler w=40ns C1 S1, S2は、BH1の 隣り合わない Segmentから選ぶ S1 S1 C2 DL=600ns S2 GDG S2 C3 GDG DL=5.6us F.T. timing signal Spill Gate Generator delay 0.3s w=2.0s

  3. BH1　最上流の検出器 Seg#5,#7, #3, #9を使用 2 segments not neighbor (with adequate rates) Logic signal (NIM) after Discriminator and Mean-timer

  4. Micro-Structure Monitor Gate DAQ Gate S1 (BH1#5 MeanTimer OUT) MSM Gate (2.0sec) Nov.15

  5. Micro-Structure Monitor - Effective Length (Efficiency) - S1,S1,C1,C2,C3: Scaler Counts: Rs1,Rs2,Rc1,Rc2,Rc3: Ave. Rate Rts1,Rts2,Rtc1,Rtc2,Rtc3: Instan. Rates T: Gate time (2.0 s.) D: Coin Time (70-80ns) e: efficiency Rs1~40KHz Rs1~10KHz Rs1=S1/T Rts1=S1/eT Rc1=C1/T Rc1=Rts1*Rts2*D =Rs1*Rs2/e2*D Rs1~40KHz Rs1~6KHz e1=Sqrt(S1*S2*D/(C1*T)) 測定条件により変わる。定量性について、要チェック

  6. Effective Length (Nov.18) S1, S2の信号源の組み合わせ、２次ビームラインの条件を変えて測定した結果 本来は同じ値になってほしいものがばらつく。

  7. Micro-Structure Monitor – Gate– T=1.8s T=1s どのあたりで平均しているかが変わる。

  8. Beam Structure　（参考） 50Hz Structure due to Ripple

  9. BMS-Monitor - Coincidence & Delay - C1 Nov.25 No delay C2 D=36ns Delay=566ns C3 Delay=56ns このdelayまでは、Coin. OUTがでる。 Coincidence Time 72ns

  10. Effective Spill Length Measurements DAQ gate (delay=0.24s, w=2.3s) Scaler gate (d=0.3s, w=2s) S1 S2

  11. Efficiencies at SX study

  12. まとめ • Eは、どの程度の割合の間、ビームが出ているかを示す指針。 • 大きい（１に近い）程、よい。 • ２次ビーム条件、信号源によって数値は変わる。（注意） • delayについては、まだStudy中 • de-banch前では、600nsの時は、1以上の数値となっていた。 • 信号をオシロでみると、本当にCoincidenceしている事象が結構ある。（TrueかAccidentalか不明） • 100nsdelay位もとってみたらどうか？

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