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Focal Plane Electronics Round Table Scientific Detector Workshop 2013 Florence, Italy

Join us at the Focal Plane Electronics Round Table in Florence, Italy, on October 10, 2013. Led by Greg Bredthauer from Semiconductor Technology Associates, Inc., this workshop will explore the evolution of Analog-to-Digital Converters (ADCs) and the diagnostic capabilities they offer. We'll discuss high sampling rates, noise reduction strategies, and techniques to analyze subtle features in signals. Key topics include ADC settling times, ringing phenomena, and balancing analog bandwidth with noise considerations for effective diagnostics in various frequency ranges.

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Focal Plane Electronics Round Table Scientific Detector Workshop 2013 Florence, Italy

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  1. Focal Plane Electronics Round Table Scientific Detector Workshop 2013 Florence, Italy 10 October 2013 Greg Bredthauer Semiconductor Technology Associates, Inc. 27122 Paseo Espada, Suite 1004 San Juan Capistrano, CA 92675 (949) 481-1595 | greg.bredthauer@sta-inc.net

  2. ADC Evolution

  3. Diagnostics

  4. Analytic Possibilities

  5. More Diagnostics

  6. Digital CDS Experience High sampling rates let you see subtle features(How fast is the CCD output settling? Is it ringing?) For higher frequencies (1 MHz), every extra sample averaged lowers noise, close to theory For lower frequencies (100 kHz), balance with 1/f noise – samples prefer to be close to SW transition Higher analog bandwidth gives faster settling, easier to avoid subtle non-linearities ADC power falls with sample rate – use lower frequencies in production after tuning

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