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Monolithic pixel sensors

Monolithic pixel sensors. Ivan Peri ć. Monolithic vs. hybrid detectors. Monolithic pixel sensor Monolithic - formed from a single crystal Pixel sensor - segmented detector of visible light or radiation. Readout pixel chip. Output signal. Readout block. Output signal.

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Monolithic pixel sensors

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  1. Monolithic pixel sensors Ivan Perić

  2. Monolithic vs. hybrid detectors • Monolithic pixel sensor • Monolithic - formed from a single crystal • Pixel sensor - segmented detector of visible light or radiation Readout pixel chip Output signal Readout block Output signal n2 chip to chip connections Sensor chip Sensor pixel chip Hybrid detector Monolithic detector

  3. Overview of monolithic sensors • Monolithic pixel sensors – three classes • 1) Pixel sensors implemented in commercial CMOS technologies • 2) Special monolithic technologies (DEPFETs, SOI-detectors) • 3) Monolithic sensors obtained by 3D integration

  4. Commercial (C)MOS monolithic pixel sensors

  5. (C)MOS monolithic sensors • The original application of CMOS sensors – consumer electronics • Imaging sensors for digital cameras and mobile phones • Such sensors be used for particle tracking, however… • certain improvements are necessary • Epi layer, hi-resistivity substrate, deep-n-well, use of true CMOS pixels • Although implemented in CMOS technologies commercial imagers use only one type of transistor in pixels – (C)MOS Phone with 41 M pixel sensor, 1.4um pixel size

  6. Commercial imaging sensors • Imaging sensors for digital cameras and mobile phones • Two basic types CMOS sensor and CCD 29 mm 54 mm Canon 120 M pixels, 2um pixelsize Teledyne DALSA 60 M pixels CCD, 6um pixelsize

  7. MOS technology • MOS Technology – Integrated circuit technology based on Metal Oxide Semiconductor field effect transistors • Field effect transistor invented in 1925 by Julius Lilienfeld • Finally realized in 1960s  „Metal“ Electrode Insulator n type region “diffusion” Silicon p type Samsung 32nm process

  8. PN junction • The simplest building element – PN junction • N-diffusion – potential valley for electrons • P-substrate –potential barrier for electrons Silicon n type Silicon p type Free electrons

  9. PN junction • Reversely biased – large depleted layer • Detector mode + Silicon n type Silicon p type Depleted

  10. PN junction • Directly biased – current flow • Not used in MOS circuits + Silicon n type Silicon p type

  11. PN junction as sensor of radiation • PN junction as sensor • 1. step - ionization Photons orparticles Ionisation Free e- Atoms

  12. PN junction as sensor of radiation • PN junction as sensor • 2. step – charge collection • Two possibilities for charge collection – drift (through E-force) and by diffusion (density gradient) Collection of electrons Atoms

  13. PN junction as sensor of radiation • PN junction as sensor • 3. step – charge to voltage conversion • Collection of the charge signal leads to the potential change Potential change Atoms

  14. MOS transistor • The basic element – MOS field effect transistor • Potential barrier between the transistor contacts can be controlled by the voltage applied at gate electrode • N-channel MOS - NMOS „Metal“ Electrode (Gate) Insulator N-type diffusion-regions (drain and source) Silicon p type Gate

  15. MOS transistor • Current flow controlled by gate-bulk voltage Insulator Silicon p type

  16. MOS transistor • Interesting: Current flow does not depend on drain voltage Insulator Silicon p type

  17. MOS transistor • Current flow controlled only by gate-bulk voltage Insulator Silicon p type

  18. CMOS pixel • Pixel sensor in MOS technology Sensor-junction MOS FET N-type region Diffusion (shallow) Or well (deep) Gate MOS FET Sensor-junction

  19. CMOS pixel • N in P diode acts as sensor element – signal collection electrode Sensor-junction MOS FET N-type region Diffusion (shallow) Or well (deep) Gate MOS FET Sensor-junction

  20. CMOS pixel • Charge generated by ionization is collected by the N-diffusion • This leads to the potential change of the N-diffusion • The potential change is transferred to transistor gate – it modulates the transistor current Sensor-junction MOS FET N-type region Diffusion (shallow) Or well (deep) Gate MOS FET Sensor-junction

  21. Rolling shutter readout • Readout principle: Many pixels (usually one row) share one readout line • Additional MOSFET used as switch • The readout lines lead to the electronics at the chip periphery that does signal processing • Monolithic detector – signal processing on the chip - fast Switch Switch A Periphery of the chip Pixel i Pixel i+1 A A A A A

  22. CCD principle • CCD principle as comparison • Potential valleys and barriers in silicon formed by proper doping. • They are controlled applying voltages on metal electrodes

  23. CCD principle • Illumination, ionization and charge collection

  24. CCD principle • Shifting of the charge • Two voltage pulses are used to raise and lower the barriers

  25. CCD principle • Shifting of the charge

  26. CCD principle • Shifting of the charge

  27. CCD principle • Charge signals are shifted to the external amplifier • No conversion to voltage occurs • Amplification and signal processing on separated chip • Slow readout

  28. (C)MOS monolithic pixel sensors for particle tracking

  29. CMOS sensors for particle tracking • Can CMOS structure be used for detection of high energy particles in particle tracking? • Yes, but fill factor is an issue – ratio of the sensitive versus insensitive area Detected Not detected Absorbed by electronics Charge collection by drift

  30. Fill-factor • Partial signal collection in the regions without E-field

  31. Fill-factor • Partial signal collection in the regions without E-field Recombination

  32. Overview • Partial signal collection in the regions without E-field Recombination

  33. Overview • Partial signal collection in the regions without E-field Charge collection by diffusion

  34. Fill-factor • Partial signal collection in the regions without E-field Charge collection by diffusion

  35. Fill-factor • In the case visible light imaging, the insensitive regions do not impose a serious problem • Light can be focused by lenses • Exposure time can be increased • In the case of particle tracking, any insensitive region should be avoided

  36. MOS pixel sensor with 100% fill factor • MOS sensor with 100% fill-factor • Based on epi-layer • Monolithic active pixel sensor - “MAPS” MOS FET NMOS N-diffusion or N-well Heavily p-doped P-well Lightly p-doped epi-layer

  37. MOS pixel sensor with 100% fill factor • Ionization in the epi-layer • Charge collection by diffusion Particle N-diffusion or N-well

  38. MAPS

  39. MOS pixel sensor with 100% fill factor - MAPS NMOS transistor in p-well N-well (collecting region) Pixel i P-type epi-layer P-type substrate Energy (e-) Charge collection (diffusion) MAPS

  40. MAPS • Many institutes are developing MAPS, for instance: IPHC Strasbourg (PICSEL group) • Family of MIMOSA chips • Applications:, STAR-detector (RHIC Brookhaven), Eudetbeam-telescope and ALICE inner tracker upgrade http://www.iphc.cnrs.fr/Monolithic-Active-Pixel-Sensors.html

  41. MAPS • Although based on simple MAPS principle – epi layer and NMOS electronics – MIMOSA chips use more complex pixel electronics • Continuous reset and double correlated sampling MIMOSA 26 forEudettelescope Ultimate chipfor STAR http://www.iphc.cnrs.fr/Monolithic-Active-Pixel-Sensors.html

  42. Charge collection & technology studies – simple demonstrators Real size prototype - yield studies Reticule 2x 2 cm 2006 Pixel Array Mimosa22 Discriminators Zero Suppression Suze 2007 Sara 2006 2008 2007 Bias Readout Final circuits – sub-blocs integration Data compression - digitization MAPS 1999 Production

  43. Advanced CMOS pixel sensors with intelligent pixels

  44. Frame readout • - Simple pixels • Signal and leakage current is collected • No time information is attached to hits • The whole frames are readout •  Small pixels •  Low power consumption •  Slow readout

  45. 3 6 9 9 9 9 Sparse readout 3 6 • - Intelligent pixels • FPN is tuned inside pixels • Leakage current is compensated • Hit detection on pixel level • Time information is attached to hits •  Larger pixels •  Larger power consumption •  Fast (trigger based) readout

  46. Intelligent pixel CR-RC Comparator Latch Bus driver CSA RAM Readout bus 4-bit tune DAC

  47. CMOS electronics • Two transistor types n-channel NMOS and p-channel PMOS are needed for the realization of complex circuits „Metal“ Electrode „Metal“ Electrode Insulator Insulator Silicon n type Silicon p type NMOS PMOS Silicon p type Silicon n type Holes PMOS Holes NMOS Free e-

  48. CMOS electronics • Example: A good voltage amplifier can only be realized with CMOS „Metal“ Electrode „Metal“ Electrode Insulator Insulator Silicon n type Silicon p type NMOS PMOS Silicon p type Silicon n type PMOS Holes NMOS Free e-

  49. MAPS structure with CMOS pixel electronics • If PMOS transistors are introduced, signal loss can happen N-well (collecting region) Pixel i NMOS transistor in p-well PMOS transistor in n-well P-type epi-layer P-type substrate Energy (e-) Signal loss Signal collection MAPS with a PMOS transistor in pixel

  50. Advanced structures: INMAPS

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