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  1. FEST ECE 477 Fall 2011 TEAM 5 Gloria Budiman Alexander Kidarsa Christopher Sakalis Vishal Gala

  2. fEST • Far • End • Speakerphone • Test • System

  3. Software design • State Machine • Different phases of test • Optimize power consumption based on current state • Interrupt Driven • Flexible peripheral control • Minimize waste of CPU time

  4. Peripherals • I2C • SCI • Mux1: Serial LCD • Mux2: SPL • SPI • A: SD card • B: Codec I/O • PWM + ADC • Timer2: 100Hz • 100 interrupts for “natural one second” (hint: BCD) • 20 interrupts for buttons sampling • Timer0: 16kHzfor codec

  5. codebase • Boring Boilerplate • Adc.c • CpuTimers.c • Epwm.c • I2C.c • PieCtrl.c • PieVect.c • Sci.c • Spi.c • SysCtrl.c • usDelay.asm • … +16 more • FatFS • ff.c • Made in EE063 • Main.c • dialog.c • gpioSetup.c • F28035_FLASH.cmd* • mmc-c28x.c* • fft.c • … more coming

  6. fatfs • FAT32 filesystem handler • Requires low-level driver • mmc-c28x.c in our case • Requires 100Hz timer

  7. The machine: state0 • Initialization spree • GPIO • PLL (Set to 60MHz) • Low Speed Peripherals Clock Prescaler (LOSPCP) • Interrupt Vectors • Initialize peripherals • Entry: (Hard) Reset • Next state: Always

  8. The machine: main • Hello World! User! • Initialize LCD • Initialize Codec • Wake the SD card upSet LOSPCP as slow as possible • Entry: User interaction, immediate from State0 • Next state: User interaction

  9. The machine: COnfiguration • Test options • Full Duplex • Far End only • Near End only • Source file selection, loop, test length • Entry: User interaction • Next state: User interaction

  10. The machine: calibration • Test output level • Volume digitally adjusted by re-programming the codec • Using Sound Pressure Level • Characterize and equalize the speaker • Entry: User interaction • Next state: User interaction

  11. The machine: preset test • Time delay • Frequency response • THD (+N?) • InterModulation Distortion • Crosstalk • …+n! more • Entry: User interaction • Next state: SD card present

  12. The machine: free-run test • Marathon burn-in test • Entry: SD card present • Next state: User interaction, pre-programmed timer exceeded, SD card full

  13. The machine: full • Detection: f_write() returns ByteWrittenless than ByteToWrite • Entry: see above • Next state: Trap state, user intervention required

  14. Memory map Not to scale As defined in F28035_FLASH.cmd RAM usage will increase as FFT joins the party

  15. Code buster • LCD is 20x4 (non-graphical) • No means of conveying graphical data • Preset Test result has to be stored somewhere if SD card is not present • f_getfree() returns number of free cluster • Problem: out-of-sync file system structure returns incorrect count

  16. Code buster • Minimize critical section • Prevent file system collapse on apocalypse

  17. Questions?