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  1. FEST ECE 477 Fall 2011 TEAM 5 Gloria Budiman Alexander Kidarsa Christopher Sakalis Vishal Gala

  2. fEST • Far • End • Speakerphone • Test • System

  3. Introduction • Speakerphone quality testing • Micro Controller • Codec • Muxes • Capacitors • etc

  4. Reliability analysis • Voltage Regulator • 2 voltage needed • 3.3V • 5V • 2 boards -> 4 needed • Gets really hot • λp = λb x πT x πT x πS x πC x πQ x πE = 0.002 x 3.7 x 3.7 x 1.0 x 1.0 x 1 x 6.0 = 0.16428

  5. Reliability analysis • Micro Controller • Main brain of the whole system • Most complex chip • Most pins • Might get warm when doing a lot of computation • λp= [C1 x πT + C2 x πE] x πQ x πL= [0.56 x 0.35 + 0.32 x 2.0] x 10 x = 8.36

  6. Reliability analysis • Codec • Used to convert digital to analog • Used to convert analog to digital • Second most pin • Second most complicated chip • λp= λBD x πMFG x πT x πCD + λBP x πE x πQ x πPT + λEOS= 0.16 x 0.55 x 0.35 x 14 + 0.0027 x 2.0 x 10 x 4.7 + 0.65= 1.335

  7. Reliability analysis

  8. FMECA

  9. FMECA

  10. FMECA P1_PS1

  11. FMECA

  12. FMECA P1_peri1

  13. FMECA

  14. FMECA P1_mcu1

  15. FMECA

  16. FMECA P2_PS1

  17. FMECA

  18. FMECA P2_ac1

  19. summary • Product should be pretty reliable • Assuming correct usage • Low Criticality • The user should not be injured should the product fail • Unless the user touches the voltage regulator directly as soon as the device fails.

  20. Questions(?_?)