1. FEST ECE 477 Fall 2011 TEAM 5 Gloria Budiman Alexander Kidarsa Christopher Sakalis Vishal Gala

2. fEST • Far • End • Speakerphone • Test • System

3. Introduction • Speakerphone quality testing • Micro Controller • Codec • Muxes • Capacitors • etc

4. Reliability analysis • Voltage Regulator • 2 voltage needed • 3.3V • 5V • 2 boards -> 4 needed • Gets really hot • λp = λb x πT x πT x πS x πC x πQ x πE = 0.002 x 3.7 x 3.7 x 1.0 x 1.0 x 1 x 6.0 = 0.16428

5. Reliability analysis • Micro Controller • Main brain of the whole system • Most complex chip • Most pins • Might get warm when doing a lot of computation • λp= [C1 x πT + C2 x πE] x πQ x πL= [0.56 x 0.35 + 0.32 x 2.0] x 10 x = 8.36

6. Reliability analysis • Codec • Used to convert digital to analog • Used to convert analog to digital • Second most pin • Second most complicated chip • λp= λBD x πMFG x πT x πCD + λBP x πE x πQ x πPT + λEOS= 0.16 x 0.55 x 0.35 x 14 + 0.0027 x 2.0 x 10 x 4.7 + 0.65= 1.335

7. Reliability analysis

8. FMECA

9. FMECA

10. FMECA P1_PS1

11. FMECA

12. FMECA P1_peri1

13. FMECA

14. FMECA P1_mcu1

15. FMECA

16. FMECA P2_PS1

17. FMECA

18. FMECA P2_ac1

19. summary • Product should be pretty reliable • Assuming correct usage • Low Criticality • The user should not be injured should the product fail • Unless the user touches the voltage regulator directly as soon as the device fails.

20. Questions(?_?)