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TOPIC : Classification of BIST Architectures

UNIT 5 : BIST and BIST Architectures. TOPIC : Classification of BIST Architectures. Module 5.1 Introduction to BIST. Requirements for BIST process. For any self testing process, the following are necessary: Circuit under test (CUT), Test pattern generator (TPG),

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TOPIC : Classification of BIST Architectures

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  1. UNIT 5 : BIST and BIST Architectures TOPIC : Classification of BIST Architectures Module 5.1 Introduction to BIST

  2. Requirements for BIST process For any self testing process, the following are necessary: • Circuit under test (CUT), • Test pattern generator (TPG), • Output response analyzer (ORA), • A distribution system (DIST) to transmit data from TPG to CUT and from CUT to ORA. • A BIST controller for controlling the BIST circuitry and the CUT during self test.

  3. BIST Architectures The BIST architectures are: • Embedded architectures • Separate architectures • In embedded architectures, the registers used for TPGs and ORAs are integral part of the functional circuit. • In separate architectures, the TPGs and ORAs are separately provided which will come into picture while testing.

  4. BIST Architectures Classification Based on the number of TPGs and ORAs that are provided for carrying out BIST operation, they are classified as: • Centralized BIST architectures – Several CUTs share TPG and ORA circuitry. This leads to reduced overhead but increased test time. • Distributed BIST architectures – Each CUT is associated with its own TPG and ORA. This leads to more overhead but less time and usually more accurate diagnosis.

  5. Contd … The classification of different BIST architectures results in 4 types of architectures: • Centralized and separate BIST • Distributed and separate BIST • Centralized and embedded BIST • Distributed and embedded BIST The detailed explanation of these different architectures are explained in detail in another presentation in resources.

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