BTM 024 qualification

1. BTM 024 qualification MRB Meeting – dd month yyyy

2. Description and reference documentation • Description of nonconformance • Problem description • Instances • Where was it found • Suspected Root cause • description • Reference NCR List • NCR n

3. Vacuum test • Vacuum test • Performed in the vacuum chamber in INFN-Roma 2. • Tray connected to the readout electronics by means of a single flex cable in order to minimize the number of the lines to be brought out of the vacuum chamber (all the FE chips read by the left GTRC). • ~20 hours @ P < 0.1 mbar, room temperature (~25 C). • Noise and gain of each single channel continuously monitored throughout the test.

4. Vacuum profile

5. Functional tests • Functional tests • Test suite run continuously during the night. • Noise and gain measured at the level of the single strip every ~15 minutes. • 80 tests performed in total, no failures detected. • One noisy channel since the beginning, no more channels were lost during the test.

6. Thermal cycles • Thermal cycles • Performed in the climatic chamber @ INFN-Pisa. • Tray connected to the TEM through both flex cables. • 4 complete cycles from -15 C to + 45 C (standard tray thermal cycles). • Noise and gain and noise occupancy of each single channel continuously monitored throughout the test.

7. Functional tests • Functional tests • Test suite run continuously throughout the whole test. • Noise and gain/noise occupancy measured at the level of the single strip every ~15 minutes. • 93 tests performed in total, no failures detected. • Final complete test suite after the thermal cycles successfully performed.

8. Conclusion • Description of nonconformance • Problem description