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Computational Analysis of Mechanical and Thermal Stresses in PProDOT-Based Redox Capacitors

This study by Idalia Ramos from the University of Puerto Rico at Humacao investigates the mechanical and thermal stresses affecting the performance of PProDOT-based redox capacitors. The research highlights how overheating during charge-discharge cycles can degrade materials and alter electrochemical properties. Utilizing computational simulations, the study explores the thermal profiles and microscopic structural properties of the device, including temperature, stress, and heat flux distributions. Insights into defects on the polymer-based electrode surface are provided, contributing to improved capacitor design.

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Computational Analysis of Mechanical and Thermal Stresses in PProDOT-Based Redox Capacitors

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  1. Computational Analysis of the Mechanical and Thermal Stresses in a Thin Film PProDOT-Based Redox Capacitor Idalia Ramos, University of Puerto Rico at Humacao, DMR 0353730 Anode Overheating of the elements in a supercapacitor and charge – discharge cycles contribute to the degradation of materials and their electrochemical properties. Pprodot film on Pt Computational Simulations are used to study two possible causes of this damage due to the thermal profile of the entire device and to its microscopic structural properties Separator Paper UHMW PE casing Teflon Cathode The temperature, stress and heat flux profiles help explain defects found on the polymer-based electrode surface after several charge-discharge cycles. NSF-DMR-0353730

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