1 / 24

Probes

Probes. Probe trade offs Probe Fabrication Probe selection Unknowns about mechanical properties of probes. Elements of a Basic Atomic force Microscope. AFM Resolution. FIGURE 2-37 SiN cantilevers are typically triangular with two arms meeting at

raheem
Télécharger la présentation

Probes

An Image/Link below is provided (as is) to download presentation Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author. Content is provided to you AS IS for your information and personal use only. Download presentation by click this link. While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server. During download, if you can't get a presentation, the file might be deleted by the publisher.

E N D

Presentation Transcript


  1. Probes • Probe trade offs • Probe Fabrication • Probe selection • Unknowns about mechanical properties of probes AFM Lab

  2. Elements of a Basic Atomic force Microscope AFM Lab

  3. AFM Resolution AFM Lab

  4. FIGURE 2-37 SiN cantilevers are typically triangular with two arms meeting at an apex. The probe on SiN probes are typically pyramidal and appear hollow at the top. (Top) Si cantilevers are typically rectangular and the probes tend to have a triangular shape to them. Si probes are crystalline and are prone to chipping and breaking if they crash into a surface. (Bottom) AFM Lab

  5. AFM Lab

  6. Cantilever Stiffness AFM Lab

  7. Equations for Cantilever AFM Lab

  8. AFM Lab

  9. AFM Lab

  10. AFM Lab

  11. AFM Lab

  12. AFM Lab

  13. AFM Lab

  14. AFM Lab

  15. This silicon probe has a 300 nm latex sphere glued to its apex. AFM Lab

  16. AFM Lab

  17. AFM Lab

  18. AFM Lab

  19. AFM Lab

  20. 080118c “Old” Probe After approximately 40 hours of usage Celgard 2 u AFM Lab

  21. 080118e “New” Probe Celgard 2 u “Best” AFM Lab

  22. Effect of Probe Sharpness on Image Quality Same sample – Celgard “New” Probe 080118 “Old” Probe AFM Lab

  23. Experiment 080201 T Imaging after approximately 10 hours usage of same probe (080118) Celgard 2 u AFM Lab

  24. AFM Lab

More Related