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Diagnostic Test Generation System and Coverage Metric for Fault Detection

This paper presents a Diagnostic Test Generation System and a novel coverage metric aimed at improving fault detection in testing circuits. The proposed system exclusively generates test patterns that can detect individual faults from pairs, enhancing efficiency in diagnostic testing. The study evaluates performance using ISCAS’85 benchmark circuits, demonstrating effective fault coverage. Researchers Yu Zhang and Vishwani D. Agrawal from Auburn University detail the methodology and results, showcasing the advancements achieved in test generation techniques and their implications for circuit design verification.

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Diagnostic Test Generation System and Coverage Metric for Fault Detection

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  1. 2010 European Test Symposium Prague, March 24-28, 2010 A Diagnostic Test Generation System and a Coverage Metric Yu Zhang and VishwaniD. Agrawal Auburn University, Dept. of ECE Auburn, AL, 36849, USA 1. Exclusive test 3. Diagnostic fault simulation Example – 8 faults, 4 vectors An exclusive test is a test that detects only one fault from a fault pair. • C0: A fault free circuit • C1: CUT with fault f1 • C2: CUT with fault f2 sa0 4. Coverage Metric Simplified: 5. Diagnostic Test Generation System sa0 2. Exclusive Test Pattern Generation 6. Results for ISCAS’85 benchmarks 1 sa0 10 3 22 20 2 Sa0 or Sa1 y 14 16 11 1 10 6 21 22 23 3 20 15 7 2 19 16 sa1 14 11 6 21 15 23 19 7 *Intel Core 2 Duo 2.66GHz, 3GB RAM. Contact email: yzz0009@auburn.edu, vagrawal@eng.auburn.edu

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