'Defect density' diaporamas de présentation

FREstimate Software Quick Start Guide

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Is Built-In Logic Redundancy Ready for Prime Time?

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Yield

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Code Properties Lecture

417 views • 36 slides

The SEMATECH Cost of Ownership Model

The SEMATECH Cost of Ownership Model. Mike Berman U of Arizona. AGENDA. Why use it? How to use it? What if? CoO of a new system Process 1 Vs Process 2 Quality Improvement Tool Summary. Purpose:.

781 views • 33 slides

Mining Metrics to Predict Component Failures

Mining Metrics to Predict Component Failures. Nachiappan Nagappan, Microsoft Research Thomas Ball, Microsoft Research Andreas Zeller, Saarland University. Overview. Introduction Hypothesis and high level description Background work and contributions Case study results

425 views • 33 slides

The SEMATECH Cost of Ownership Model

The SEMATECH Cost of Ownership Model. Mike Berman U of Arizona. AGENDA. Why use it? How to use it? What if? CoO of a new system Process 1 Vs Process 2 Quality Improvement Tool Summary. Purpose:.

340 views • 33 slides

Best Practices: Operations in a Fabless Startup

Best Practices: Operations in a Fabless Startup. Gina Gloski President Semiconductor Operations Consulting. Topics. Planning for Operations Resource Requirements Fixed Operations Costs Variable Cost Factors Key Things to Remember. Planning For Operations.

631 views • 31 slides

Agile Software Engineering

Agile Software Engineering. Bharath Padmanabhan ? University of Kansas ? Spring 2014. Scrum & Engineering Practices: Experiences of Three Microsoft Teams. Gabe Brown, Adam Meltzer, Nachiappan Nagappan Microsoft Corporation Redmond, WA 98052, USA

518 views • 29 slides

To Evaluate Benefits Realization to SPI Using CBD Architecture

To Evaluate Benefits Realization to SPI Using CBD Architecture. Nov. 5. 2003. Kyung whan Lee, professor Computer Science and Engineering Division, Chung-Ang University (Kwlee@object.cau.ac.kr). Table of Contents. Introduction Performance Measures and GQM Approach

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Defect Removal Metrics

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Scalable Hierarchical Yield Control System For Semiconductor Manufacturing A Feasibility Study

Scalable Hierarchical Yield Control System For Semiconductor Manufacturing A Feasibility Study. Bill Martin, Jill Card, Wai Chan, Joyce Hyde, Yi-Min Lai IBEX Process Technology A Division of Neumath, Inc., Haverhill, MA John Doxsey, Paul Fearon National Semiconductor, S. Portland ME.

477 views • 25 slides

Defect Removal Metrics

349 views • 21 slides

Information Systems Overview

Information Systems Overview. Organizing Complex Projects Around Risks Arising From System Dynamic Behavior Neil Siegel Sector Vice-President & Chief Engineer Northrop Grumman 9 March 2011. Agenda. Scope Hypothesis The design-based technique Research results Summary.

300 views • 19 slides

Defect Analytics Marist/IBM Joint Studies

Michael Gildein 09 June 2014. Defect Analytics Marist/IBM Joint Studies. Defect Analytics - Marist/IBM Joint Studies. Agenda. Team Background Conventional Defect Analysis & Tracking Data Original Project Infrastructure Defect Data Warehouse Current Research Future.

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Reliability of ZrO 2 films grown by atomic layer deposition

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Defect Density Estimation through Verification and Validation

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A Brief Overview of the Indian IT Industry & Infosys

A Brief Overview of the Indian IT Industry & Infosys. February, 2006. A brief look at the Indian Economy. Rapidly growing GDP of 7.5%-8% Services sector has more than 50% weightage in GDP Structural drivers for growth Large population and favorable demographic trends

406 views • 14 slides

The Impact of Agile. Quantified.

The Impact of Agile. Quantified. Using the Software Development Performance Index to benchmark Agile transformation. The Software Development Performance Index

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313 views • 11 slides