'Defect level' diaporamas de présentation

Defect level - PowerPoint PPT Presentation

Bas ic data about TTU

Bas ic data about TTU

Bas ic data about TTU. Founded as engineering college in 1918, TTU acquired university status in 1936. TTU has about 9 0 00 students and 1 209 employees, offering engineering and economics diploma studies, bachelor, master and doctorate degree programmes.

★ ★ ★ ★ ★

1.32k views • 117 slides
Design for Testability

Design for Testability

Design for Testability. ??? (03)5773693#157 jbchen@cic.org.tw. Agenda. Logic Testing Basic Concept Design for Testability RTL Rule Checker DFT Guidelines and Rules Synopsys DFT Design Flow Memory Testing Basic Concept Memory BIST SynTest SRAMBIST Flow.

★ ★ ★ ★ ★

2.94k views • 115 slides
T est G eneration and F ault S imulation for Digital Systems

T est G eneration and F ault S imulation for Digital Systems

T est G eneration and F ault S imulation for Digital Systems. Kharkov National University of Radioelectronics Kharkov, Ukraine April 5-7, 2004. Raimund Ubar Tallinn Technical University D&T Laboratory Estonia. Motivation of the Course.

★ ★ ★ ★ ★

1.06k views • 96 slides
The Testing Issues on System-in-Package Design Methodology

The Testing Issues on System-in-Package Design Methodology

The Testing Issues on System-in-Package Design Methodology. Speaker ? Meng-Syue Chan Advisor ? Chun-Yao Wang 2008-07-10 Department of Computer Science National Tsing Hua University, Taiwan. Outline. Introduction Quality-Cost Evaluation Models Interconnect Testing

★ ★ ★ ★ ★

535 views • 43 slides
The Testing Issues on System-in-Package Design Methodology

The Testing Issues on System-in-Package Design Methodology

The Testing Issues on System-in-Package Design Methodology. Speaker ? Meng-Syue Chan Advisor ? Chun-Yao Wang 2008-06-24. Outline. Introduction Quality-Cost Evaluation Models Integer Linear Programming Our Approach Interconnect Testing With Stuck-at Fault Model

★ ★ ★ ★ ★

550 views • 42 slides
Cpt 14 TEST

Cpt 14 TEST

Cpt 14 TEST Key terms and concepts: production test, wafer test or wafer sort, probe card, production tester, test program, test response, test vector, final test, goods-inward test, printed-circuit board ( PCB or board), failure analysis, field repair 14.1 The Importance of Test

★ ★ ★ ★ ★

427 views • 42 slides
VLSI Testing Lecture 12: Alternate Test

VLSI Testing Lecture 12: Alternate Test

VLSI Testing Lecture 12: Alternate Test. Dr. Vishwani D. Agrawal James J. Danaher Professor of Electrical and Computer Engineering Auburn University, Alabama 36849, USA vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal IIT Delhi, July 30, 2012, 4:00-5:00PM. Contents.

★ ★ ★ ★ ★

153 views • 15 slides
DPPM for Analog and RF Circuits

DPPM for Analog and RF Circuits

DPPM for Analog and RF Circuits. Vishwani D. Agrawal Auburn University, Auburn, AL 36849, USA vagrawal@eng.auburn.edu Suraj Sindia Intel Corporation, Hillsboro, OR 97124, USA szs0063@auburn.edu 32nd IEEE VLSI Test Symposium Napa, California April 14, 2014. Problem Statement.

★ ★ ★ ★ ★

223 views • 6 slides

View Defect level PowerPoint (PPT) presentations online in SlideServe. SlideServe has a very huge collection of Defect level PowerPoint presentations. You can view or download Defect level presentations for your school assignment or business presentation. Browse for the presentations on every topic that you want.