'Detector module' diaporamas de présentation

CBM Silicon Tracking System. R esults of the pre- prototype detector module test .

V.M. Pugatch Kiev Institute for Nuclear Research. CBM Silicon Tracking System. R esults of the pre- prototype detector module test. Thanks to coauthors: M. Borysova 1 , J.M. Heuser 2 , O. Kovalchuk 1 , V. Kyva 1 , Lymanets 1,3 , V. Militsiya 1 , O. Okhrimenko 1 , A. Chaus 1 ,

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The ATLAS Beam Condition Monitor Commissioning

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Joao Varela, LIP CERN Technology Day , FCUL 2 March 2017

From Particle Physics to Medical Imaging How a Portuguese start-up was born from the collaboration with CERN. Joao Varela, LIP CERN Technology Day , FCUL 2 March 2017. The LHC proton collider. Particle Physics @ LHC. LIP LABORATORY OF INSTRUMENTATION AND PARTICLES.

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The ATLAS Inner Detector

The ATLAS Inner Detector. Steve McMahon / RAL. LHC accelerator. Geneva Airport. Welcome to CERN. CERN 2nd site. SPS accelerator. CERN main site. It is your laboratory. General purpose detectors (good for everything...). ATLAS. CMS. LHCb. ALICE. dedicated for

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Microstrip detector R&D @ GSI-CIS

Microstrip detector R&D @ GSI-CIS. Update on ongoing and launched activities. Johann M. Heuser, GSI Li Long, CIS CBM Collaboration Meeting, GSI, 27.2.2008. I. II. n side: "vertical" strips. p side "double metal". blue: double metal connect- ions of strips I to III. III.

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LAr1 Plans at FNAL

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ATLAS Pixel Upgrade Phase 0 (IBL)

ATLAS Pixel Upgrade Phase 0 (IBL). ACES Workshop 2014 18.-20.03.2014, CERN T . Flick University Wuppertal f or the IBL collaboration. ATLAS Phase 0 Upgrade: Insertable B- Layer.

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Quality Assurance, Testing and Burn-in WBS 1.1.4

Quality Assurance, Testing and Burn-in WBS 1.1.4. Cecilia Gerber University of Illinois at Chicago. Production and Testing Sequence. WBS 1.1.1. WBS 1.1.2. WBS 1.1.2. Silicon Sensors. SVX4 Chips. Hybrids. Test Chips. Test Bare Hybrid (KU, CSUF). Probe Test Silicon Sensor in house

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Status Wuppertal

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A reminder of the outstanding action list:-

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Classification of the channel output (Readout electronics test):

2T module. 3T module. Chip. Gain. Output Noise. Input Noise. Chip. Gain. Output Noise. Input Noise. 1. 52,50. 28,00. 0,53. 1. 52,60. 22,00. 0,42. 2. 51,00. 27,00. 0,53. 2. 50,50. 20,00. 0,40. 3. 53,00. 28,00. 0,53. 3. 50,75. 20,00. 0,39. 4. 50,00. 24,50. 0,49.

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