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EE434 ASIC & Digital Systems

EE434 ASIC & Digital Systems

EE434 ASIC & Digital Systems. Jacob Murray School of EECS Washington State University jmurray@eecs.wsu.edu. Test Methodologies. Adopted from “Essentials of Electronic Testing” by Bushnell and Agrawal. Lecture 30. Built-In Self-Testing Response Compaction. Motivation and economics

By paytah
(71 views)

EE434 ASIC & Digital Systems

EE434 ASIC & Digital Systems

EE434 ASIC & Digital Systems. Jacob Murray School of EECS Washington State University jmurray@eecs.wsu.edu. Test Methodologies. Adopted from “Essentials of Electronic Testing” by Bushnell and Agrawal. Lecture 29. Built-In Self-Testing Pattern Generation. Motivation and economics

By walker
(150 views)

Pseudorandom Testability – Study of the Effect of the Generator Type

Pseudorandom Testability – Study of the Effect of the Generator Type

Pseudorandom Testability – Study of the Effect of the Generator Type. Petr Fišer, Hana Kubátová Czech Technical University in Prague Dept. of Computer Science & Engineering Karlovo nám. 13, CZ-121 35, Prague 2, Czech Rep. E-mail: fiserp@fel.cvut.cz, kubatova@fel.cvut.cz. Outline.

By matteo
(70 views)

Up and Down Counter with a Seven Segment Display Encoder

Up and Down Counter with a Seven Segment Display Encoder

Part 1. Implementing Sequential Logic in VHDL. Up and Down Counter with a Seven Segment Display Encoder. S6. S5. S4. S3. S2. S1. S0. DP. Block diagram of the counter. Experiment 2 Problem 1 Pseudo-Random Number Generator. Linear Feedback Shift Register (LFSR).

By turi
(153 views)

Digital Systems and Media Computing Laboratory School of Science & Technology

Digital Systems and Media Computing Laboratory School of Science & Technology

A High-Speed Hardware Implementation of the LILI-II Keystream Generator Paris Kitsos ...in cooperation with Nicolas Sklavos and Odysseas Koufopavlou. Digital Systems and Media Computing Laboratory School of Science & Technology Hellenic Open University, Patras, Greece

By enan
(98 views)

An Interconnect BIST for Crosstalk Faults based on a Ring LFSR

An Interconnect BIST for Crosstalk Faults based on a Ring LFSR

An Interconnect BIST for Crosstalk Faults based on a Ring LFSR. T. Garbolino, K. Gucwa, A. Hławiczka , M. Kopeć Institute of Electronics Silesian University of Technology, Gliwice, Poland. EWDTS’09, September 18-21, 2009, Moscow, Russia. Outline.

By etenia
(130 views)

Bhupendra Singh Scientist ‘B’ scientistbsingh@gmail

Bhupendra Singh Scientist ‘B’ scientistbsingh@gmail

Bhupendra Singh Scientist ‘B’ scientistbsingh@gmail.com Centre for Artificial Intelligence and Robotics (CAIR) Defence Research and Development Organization Bangalore.

By jerome
(89 views)

ECE 5440/6370 Advanced Digital Design

ECE 5440/6370 Advanced Digital Design

ECE 5440/6370 Advanced Digital Design. Lecture on Debouncing Circuit Yuhua Chen Spring 2010. Debouncing Circuit. A mechanical switch (key-press) usually results in momentary oscillating behavior. Switch Output Voltage (A). +5V. R. A. Scope Shots of Switch Bounce - Closing. @ Node A.

By xandy
(119 views)

Stream Ciphers

Stream Ciphers

Stream Ciphers. Stream Ciphers. Generalization of one-time pad Trade provable security for practicality Stream cipher is initialized with short key Key is “stretched” into long keystream Keystream is used like a one-time pad XOR to encrypt or decrypt

By jean
(216 views)

More Digital circuits

More Digital circuits

More Digital circuits. Ripple Counter. The most common counter The problem is that, because more than one output is changing at once, the signal is glichy To avoid this problem, use Gray or Johnson code. Johnson Counter. The Johnson counter is type of shift counter

By spike
(175 views)

Pseudo-Random Pattern Generator Design for Column‑Matching BIST

Pseudo-Random Pattern Generator Design for Column‑Matching BIST

Pseudo-Random Pattern Generator Design for Column‑Matching BIST. Petr Fišer Czech Technical University Dept. of Computer Science and Engineering. Outline. Introduction Mixed-Mode Column-Matching BIST Weighted-Pattern testing & splitter Results Conclusions. Introduction.

By aretha
(164 views)

Built-In Self-Test

Built-In Self-Test

Built-In Self-Test. Built-in Self Test (BIST). Basics Test Pattern Generators Response Analyzers BIST Examples BIST of PLAs. BIST. BIST - General Organization. Test Generator. Circuit Under Test (CUT). Response Compressor. BIST Basics. BIST - Goal.

By gyda
(478 views)


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