'Manufacturing test' diaporamas de présentation

Testing of Digital Systems: An Introduction

Testing of Digital Systems: An Introduction. Dr. Aiman H. El-Maleh Computer Engineering Department King Fahd University of Petroleum & Minerals. Outline. Introduction Manufacturing Cost Defects, Faults, Fault Models Automatic Test Pattern Generation Scan Testing Methodology

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Design for Testability

Design for Testability. Outline. Testing Logic Verification Silicon Debug Manufacturing Test Fault Models Observability and Controllability Design for Test Scan BIST Boundary Scan. Testing. Testing is one of the most expensive parts of chips

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VLSI DESIGN Lecture 10 Design for Testability

VLSI DESIGN Lecture 10 Design for Testability. Outline. Testing Logic Verification Silicon Debug Manufacturing Test Fault Models Observability and Controllability Design for Test Scan BIST Boundary Scan. Testing. Testing is one of the most expensive parts of chips

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VLSI DESIGN Lecture 10 Design for Testability

VLSI DESIGN Lecture 10 Design for Testability. Outline. Testing Logic Verification Silicon Debug Manufacturing Test Fault Models Observability and Controllability Design for Test Scan BIST Boundary Scan. Testing. Testing is one of the most expensive parts of chips

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Fault Modeling & Testing of VLSI Circuits

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EE466: VLSI Design Lecture 17: Design for Testability

EE466: VLSI Design Lecture 17: Design for Testability. Outline. Testing Logic Verification Silicon Debug Manufacturing Test Fault Models Observability and Controllability Design for Test Scan BIST Boundary Scan. Testing. Testing is one of the most expensive parts of chips

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Test Economics for Homogeneous Manycore Systems

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Test Economics for Homogeneous Manycore Systems

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Design for Testability

Design for Testability. Outline. Testing Logic Verification Silicon Debug Manufacturing Test Fault Models Observability and Controllability Design for Test Scan BIST Boundary Scan. Testing. Testing is one of the most expensive parts of chips

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Lecture 5: Design for Testability

Lecture 5: Design for Testability. Outline. Testing Logic Verification Silicon Debug Manufacturing Test Fault Models Observability and Controllability Design for Test Scan BIST Boundary Scan. Testing. Testing is one of the most expensive parts of chips

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Motivation

Motivation. Testability is an important quality metric in electronic systems Cost of test is beginning to dominate the per-part cost of mant silicon products, e.g., in consumer market

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Homework

Homework. Reading 7400 TTL Logic Data Sheets Machine Projects MP3 due at start of class today Start looking at MP4 now Labs Continue labs with your assigned section. MP3 Discussion. What did you learn in MP3?. 7400 Series Logic Implementation. Transistor-Transistor-Logic (TTL) Chips

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Topdogtest electronic test equipment

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alliancetesteq.com

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145 views • 5 slides