'Scan chains' diaporamas de présentation

HAsim FPGA-Based Processor Models: Fast, Accurate and Flexible

HAsim FPGA-Based Processor Models: Fast, Accurate and Flexible. Michael Adler Elliott Fleming Michael Pellauer Joel Emer. Outline. Problem & goals Basic model structure Modeling a pipelined microarchitecture Modeling memory hierarchies Modeling multiprocessors

535 views • 35 slides

Incremental Multiple-Scan Chain Ordering for ECO Flip-Flop Insertion

Incremental Multiple-Scan Chain Ordering for ECO Flip-Flop Insertion. Andrew B. Kahng, Ilgweon Kang and Siddhartha Nath VLSI CAD LABORATORY, UC San Diego 32 nd IEEE/ACM International Conference on Computer-Aided Design November 20 th , 2013. Outline. Motivation

487 views • 32 slides

EE 587 SoC Design & Test

EE 587 SoC Design & Test. Partha Pande School of EECS Washington State University pande@eecs.wsu.edu. Low-Power Testing. Testing & Power. THE SYSTEM-ON-A-CHIP (SoC) revolution brings out new challenges for both the design and test engineers, especially in the area of power dissipation

397 views • 30 slides

System-on-Chip (SoC) Testing

System-on-Chip (SoC) Testing. SoC Wrapper/TAM Design. Scan Chain Architectures*. * J. Aerts and E. J. Marinissen, ITC 1998, pp. 448-457. Paper Summary. Given: # pins SoC available for external scan test # scan patterns of each core # scan FFs in each core

723 views • 26 slides

Deterministic Diagnostic Pattern Generation (DDPG) for Compound Defects

International Test Conference Santa Clara , CA, Oct 26-Oct 31, 2008. Deterministic Diagnostic Pattern Generation (DDPG) for Compound Defects.

490 views • 25 slides

Advanced ITC Presentation

Advanced ITC Presentation. A. Pogiel J. Rajski J. Tyszer. Motivation. Reliable test response compactor. volume reduction higher than scan chains / channels ratio high observability of scan cells for wide range of X-profiles design simplicity minimum control information. Outline.

296 views • 19 slides

Advanced ITC Presentation

Advanced ITC Presentation. A. Pogiel J. Rajski J. Tyszer. Motivation. Reliable test response compactor. volume reduction higher than scan chains / channels ratio high observability of scan cells for wide range of X-profiles design simplicity minimum control information. Outline.

258 views • 19 slides

Design of Test Access Mechanism for AMBA-Based System-on-a-Chip

400 views • 17 slides