'Test access' diaporamas de présentation

Chapter 4

Chapter 4. System/Network-on-Chip Test Architectures. What is this chapter about?. Introduce basic and advanced architectures for: System-on-Chip (SOC) Testing Network-on-Chip (NOC) Testing Further focus on: Testing on On-Chip Networks Design and Test Practices in Industry.

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R&D for Embedded Analogue Testing

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Lecture 31 System Test (Lecture 22alt in the Alternative Sequence)

Lecture 31 System Test (Lecture 22alt in the Alternative Sequence). Definition Functional test Diagnostic test Fault dictionary Diagnostic tree System design-for-testability (DFT) architecture System partitioning Core test-wrapper DFT overhead Summary. A System and Its Testing.

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Lecture 31 System Test

Lecture 31 System Test. Definition Functional test Diagnostic test Fault dictionary Diagnostic tree System design-for-testability (DFT) architecture System partitioning Core test-wrapper DFT overhead Summary. A System and Its Testing.

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Lecture 31 System Test

Lecture 31 System Test. Definition Functional test Diagnostic test Fault dictionary Diagnostic tree System design-for-testability (DFT) architecture System partitioning Core test-wrapper DFT overhead Summary. A System and Its Testing.

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VLSI Testing Lecture 12: System Diagnosis

VLSI Testing Lecture 12: System Diagnosis. Definition Functional test Diagnostic test Fault dictionary Diagnostic tree System design-for-testability (DFT) architecture System partitioning Core test-wrapper DFT overhead Summary. A System and Its Testing.

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VLSI Testing Lecture 12: System Diagnosis

VLSI Testing Lecture 12: System Diagnosis. Definition Functional test Diagnostic test Fault dictionary Diagnostic tree System design-for-testability (DFT) architecture System partitioning Core test-wrapper DFT overhead Summary. A System and Its Testing.

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VLSI Testing Lecture 14: System Diagnosis

VLSI Testing Lecture 14: System Diagnosis. Definition Functional test Diagnostic test Fault dictionary Diagnostic tree System design-for-testability (DFT) architecture System partitioning Core test-wrapper DFT overhead Summary. A System and Its Testing.

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On-chip, at-speed debug and DFT support for OCP-based SOCs Heinz Holzapfel

On-chip, at-speed debug and DFT support for OCP-based SOCs Heinz Holzapfel. November 27, 2014. Overview. DFT and DFD Challenges Technology Driving DFT/DFD Changes Access, Complexity, Scheduling Problems Using Current Embedded-Core DFT The Configurable Test Access Solution

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ELEC 7770 Advanced VLSI Design Spring 2007 VLSI System DFT

ELEC 7770 Advanced VLSI Design Spring 2007 VLSI System DFT. Vishwani D. Agrawal James J. Danaher Professor ECE Department, Auburn University Auburn, AL 36849 vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal/COURSE/E7770_Spr07. SOC Design: A DFT Problem.

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Flash Memory Built-In Self-Test Using March-Like Algorithms

Flash Memory Built-In Self-Test Using March-Like Algorithms. Jen-Chieh Yeh, Chi-Feng Wu, Kuo-Liang Cheng, Yung-Fa Chou, Chih-Tsun Huang, and Cheng-Wen Wu. Outline. Flash Memory Testing Issues Target Fault Models Flash Memory Test Algorithms Built-In Self-Test (BIST) Experimental Results

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Analog & Mixed-Signal Test Where are we going to?

analogue embedded testing. The question is?. Analog & Mixed-Signal Test Where are we going to?. or The question should be:. Analog & Mixed-Signal Test Where do we have to go?. The answer is:. We are going to where we have to go. That is. On-Chip Test Manager. Stimuli generation

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UNLOCKING THE POWER OF BOUNDARY-SCAN

UNLOCKING THE POWER OF BOUNDARY-SCAN. World Wide Users. 3Com ABB August Systems AGFEO Alcatel AscomTelecom. Atlas Copco Barco Graphics Blaupunkt Bofors Celestica Compaq Datex ECI EKB. Ericsson Ericsson Intracom Force Computer Fujitsu Microelectronics Fujitsu Telecom

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Middleware:

Middleware:. Gluing the Warehouse Together. Chapter 19 by Gausden and Mason from Data Warehouse , Bischoff & Alexander. Business Issues for Middleware. Definition: software that shields users and developers from differences in services and resources used by applications

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Provision of Partial Baseband Private Circuits - Change-over Considerations

Provision of Partial Baseband Private Circuits - Change-over Considerations. Mike Ainger Transmission Design & Planning Manager Racal Telecom

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