'Test pattern generation' diaporamas de présentation

Design Compiler & TetraMAX

Design Compiler & TetraMAX . Prepared by Abel Hu. Outline. Design Compiler overview setup circuit Environment setup circuit parameters Run Compiler Compile Design Report Design TetraMAX- Automatic Test Pattern Generator Sequential Test Generation ????. Design Compiler ??.

2.56k views • 61 slides

Dictionary-Less Defect Diagnosis as Real or Surrogate Single Stuck-At Faults

618 views • 54 slides

Introduction to CMOS VLSI Design Test

Introduction to CMOS VLSI Design Test. Outline. Testing Logic Verification Silicon Debug Manufacturing Test Fault Models Observability and Controllability Design for Test Scan BIST Boundary Scan. Testing. Testing is one of the most expensive parts of chips

693 views • 40 slides

473 views • 35 slides

ELEN 468 Advanced Logic Design

ELEN 468 Advanced Logic Design. Lecture 23 Testing. Verifies correctness of design Performed by simulation, hardware emulation, or formal methods Performed prior to manufacturing. Verifies correctness of manufactured hardware Two-part process:

453 views • 33 slides

Testimise projekteerimine: Labor 2 BIST Optimization

Testimise projekteerimine: Labor 2 BIST Optimization. Sergei Kostin. BIST (Built-in Self Test). BIST Control Unit. Test Pattern Generator (PRPG). BIST Memory. Circuit Under Test (CUT). Output Response Analyzer ( MISR ).

282 views • 28 slides

Lecture 12: Design for Testability

Lecture 12: Design for Testability. Outline. Testing Logic Verification Silicon Debug Manufacturing Test Fault Models Observability and Controllability Design for Test Scan BIST Boundary Scan. Testing. Testing is one of the most expensive parts of chips

546 views • 26 slides

Config 1)

Config 1). Disable the HS TP that you are using now. Config 2). go to the PCS Control Cfg tab within the GUI and active either the TX/RX Test Pattern Generation or the PRBS31 Test Pattern Generation on TX/RX path. Eye pattern. Comments : A little better than before.

146 views • 3 slides