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MICE/AFE II t Update

MICE/AFE II t Update. IIT Analog Front End (AFE) Test Stand AFE Conceptual Design Report (CDR). Terry Hart, Illinois Institute of Technology, February 10, 2006. AFE II t Overview.

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MICE/AFE II t Update

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  1. MICE/AFE II t Update • IIT Analog Front End (AFE) Test Stand • AFE Conceptual Design Report (CDR) Terry Hart, Illinois Institute of Technology, February 10, 2006

  2. AFE II t Overview • The D0 Central Fiber Tracker uses AFE I boards to collect digital hit pattern and charge amplitude information from input charge signals. • AFE II boards were developed as prototypes for the D0 upgrade to AFE II t and have been used by MICE for the KEK test beam. • A D0 upgrade of the AFE II boards is a modified chip which will provide timing information (AFE II t). • MICE fiber trackers will use AFE II t boards for the data readout. - The MICE group will assist in the testing of the AFE II t boards. - An IIT test stand will be assembled soon. - Another RAL test stand will be set up in late March.

  3. AFE II Test Stand at D0 • Two AFE II boards installed in one of the two cassettes of the cryostat. • Cryostat will be tilted by about 20° and temperature stability will be checked.

  4. IIT AFE II t Test Stand • IIT People: Dan Kaplan, Terry Hart, Bill Luebke, Dan Olive • Key contributors: Paul Rubinov, Malcolm Ellis • We have most of the hardware components at Fermilab and IIT. The IIT test stand will be set up at Fermilab. • Computer with diagnostic software • VME64 to PCI adapter with fiber optic cable • We are expecting one of the 16 AFE II t pre-production boards soon.

  5. IIT AFE II t Test Stand • Bob Angstadt has installed driver for SBS 810 VME 64 to PCI adapter and diagnostic software on our computer. • Single word and DMA block transfers work (See next slide.). • We will also learn about • Further hardware tests with the IIT AFE II t test stand. • What AFE board tests we should do specifically for MICE.

  6. VME Bus Analyzer Output of DMA Test | TIME BUS ADDRESS DATA R/W SIZE STAT IRQ* IACK* AMEX | rel. LEVEL 7654321 OC IO -----+--------------------------------------------------------------------- =>TRIG| 0 ns - C6000000 ....0001 W WORD OK ---4--- 1 0 09 1 1| 4.44 us - C6000000 ....0001 W WORD OK ---4--- 1 0 09 1 2| 3.40 us - C6000000 ....0001 W WORD OK ---4--- 1 0 09 1 3| 3.36 us - C6000000 ....0001 W WORD OK ---4--- 1 0 09 1 4| 3.48 us - C6000000 ....FFFF R WORD OK ---4--- 1 0 09 1 5| 4.00 us - C6000000 ....FFFF R WORD OK ---4--- 1 0 09 1 6| 3.96 us - C6000000 ....FFFF R WORD OK ---4--- 1 0 09 1 7| 3.92 us - C6000000 ....FFFF R WORD OK ---4--- 1 0 09 1 8| 3.96 us - C6000000 ....FFFF R WORD OK ---4--- 1 0 09 1 9| 4.08 us - C6000000 ....0001 W WORD OK ---4--- 1 0 09 1 10| 3.40 us - C6000000 ....0001 W WORD OK ---4--- 1 0 09 1 11| 3.36 us - C6000000 ....0001 W WORD OK ---4--- 1 0 09 1 12| 3.36 us - C6000000 ....0001 W WORD OK ---4--- 1 0 09 1 13| 25.2 us - ..000000 B9D4FFFF R LONG OK ---4--- 1 0 3B 1 14| 80 ns - ..000000 B9D4FFFF BLK LONG OK ---4--- 1 0 3B 1 15| 80 ns - ..000000 B9D4FFFF BLK LONG OK ---4--- 1 0 3B 1 Time:T Group:1,2,3 Disas:D Jump:J Search:S Extr:E Help:? Print:^P Quit:Q Ok. Successful DMA transfer One long word (4 bytes) every 80 ns  47.4 MB/sec.

  7. IIT Test Stand Anticipated Schedule • D0 AFE II t production schedule + Next week: Receive 16 pre-production boards. + Feb. - March: Test pre-production boards during D0 data taking. + March - May: Debug and fix pre-production boards. + May - June: Full scale production of AFE II t boards. • Learn about AFE II t boards by helping D0 with their test stand - now through next few months. • Learn about FPGA programming and firmware necessary for MICE operation of AFE II t boards, and define requirement by mid-2006. • Have working hardware (16 boards + spares) by Fall, 2006.

  8. D0 AFE II t Test Stand

  9. AFE II t CDR • Preparation of a CDR of the AFE II t board is underway and an initial draft is being reviewed. • The CDR will include • MICE, ISIS, and AFE board introduction and motivation • Block diagram and/or schematic drawing of the AFE boards • Specific requirements for various data running modes • Charge and time data • Discriminator data • Requirements for achieving data acquisition of as many as 600 muons/ms from current capability of 225 muons/ms. • This may develop into a Technical Reference Document (TRD) for the AFE II t for MICE.

  10. AFE II t Data Rates • VME to PC data throughput should be fine for MICE - If MICE uses a data word format similar to that used for the KEK tests, each muon event with charge and time information will have about 65,280 bytes. - (600 muons/sec)(65,280 bytes) = 37.3 MB/sec. This is achievable with the 47.4 MB/sec capability mentioned earlier. • Full digitization of charges and times limit reconstruction rate to about 225 muons/spill. - Total digitization time for 32 channels on a TRIP-t chip is about 4.4 s or about 225 muons/sec. - If only discriminator information is used (Hit or no hit?), maximum instantaneous rate is about 7000 muons/sec. - MICE/AFE II t CDR discusses this in detail.

  11. MICE/AFE II t Plans • Prepare CDR and TRD. • Set up IIT test stand to become part of the D0 AFE II t tests. • Determine special MICE requirements and test AFE II t boards for these. • Set up RAL test stand for tracker quality control.

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