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Mu2e Italian Meeting on FEE/WD Requirements and Mechanics

This two-day meeting focuses on clean specifications and simulations for Dose, RIN, and Pileup impacts, along with discussions on TEDR updates. Discussions include photosensors, FEE/WD, and mechanics aspects. Radiation hardness simulations and the Calorimeter's design are reviewed. Safety factors, TID levels, current flow on SiPMs due to irradiation damage, and crystal qualifications are critical topics.

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Mu2e Italian Meeting on FEE/WD Requirements and Mechanics

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  1. Introduction and FEE/Wd requirements • Meeting introduction • Requirements on Dose • Requirements on current • Requirements on pileup • Next steps S.Miscetti LNF-INFN Frascati LNF 7-11-2016 Mu2e Italian meeting

  2. Introduction • 2 days meeting dedicated to FEE + WD + mechanics • Discussion and practical arguments outside formal presentations • For electronics, we need to clean up “specifications” and simulation for Dose, RIN and Pileup  impact also on crystals stuff. • Need to discuss about TEDR  Motivations: update from TDR, H2020, our own internal consistency. Tomorrow, I will provide a copy of TEDR to all of you. Then I will sent it to Ron/David.  If you agree, I propose a dedicated chapter (INFN based) for: 1) photosensors (Miscetti, Sarra, DiFalco) 2) FEE+WD (Miscetti, Corradi, Spinella) and 3) one for mechanics (Happacher, Saputi, Raffaelli, Grancagnolo).  Crystals and simulation we should do it with USA contribution. They should start as DOCDB notes and then be inserted in this document. S.Miscetti Introduction @ Mu2eItaly

  3. The Mu2e experiment: pulsed beam structure • To reduce the contribution • of the prompt background, • Mu2euses a pulsed beam. • The Microbunch structure • well matches the μ lifetime • in the bound system (826 ns) • Data are acquired only • starting from 700 ns after • the beam arrival on target. • Negligible contribution • remains from prompt bkg. • Wait for rates associated with the beam flash to subside before looking for conversion electrons. • The beam flash still • dominates the radiation dose. Beam on ( 380 ms) beam off (1020 ms) 8 batches of 43.1 ms, 5 ms gap S.Miscetti - Calorimeter Technical Review

  4. Radiation Hardness (simulation before CD-3) • Radiation dose driven by • Beam flash (300 ns from • Interaction of proton • beam on target).Dose from • Muon capture x 10 smaller • Strongly limited to inner • radius (up to 400 mm) • Highest dose/year • ~ 10 krad • Highest n flux/year • on crys. ~ 2x10 11 n/cm2 • Highest dose/year on • SIPM ~ 6x1010 n_1Meveq/cm2 Innermost radius was at 360 mm. Radius = 36 cm Rad-Hard test: qualify crystals up to 100 krad, 10 12 n/cm2 Qualify photo-sensors up to 3x1011 n_1MeV/cm2 Includes a safety factor of 3 3 years run S.Miscetti - Calorimeter Final Design Review

  5. Introduction and Scope The Calorimeter consists of two disks with 674 CsI 34x34x200 mm3 square crystals: • Rinner = 374 mm, Router=660 mm, depth = 10 X0 (200 mm) • Each crystal is readout by two large area UV extended SiPM’s (14x20 mm2) • Analog FEE is on the SiPM and digital electronics is located in near-by electronics crates • Radioactive source and laser system provide absolute calibration and monitoring capability S. Miscetti | DOE CD-3c Review

  6. Radiation Hardness (simulation after CD-3) Innermost radius was is now at 374 mm. • It improves situation on innermost disk of a factor of 2. Now highest dose is of 5 krad/year. Considering 2x107 sec  5600 hours  1 rad/hour • WE SHOULD EXTRACT DOSE ON SiPMs of INNERMOST RADIUS S.Miscetti Introduction @ Mu2eItaly

  7. Radiation Hardness neutrons (simulation) Radius = 36 cm 3 years run Rad-Hard test: qualify crystals up to 100 krad, 10 12 n/cm2 Qualify photo-sensors up to 3x1011 n_1MeV/cm2 Includes a safety factor of 3 WE SHOULD REDO THE CALCULATION FOR NEUTRONS! BOTH FOR CRYSTALS AND SIPMS + FEE. FOR WD region calculation have been done by VITALY  See next slide S.Miscetti - Calorimeter Final Design Review

  8. Irradiation dose: Safety Factors and TID(max) • Electronics integration group • Increased safety factors value • from 3 to 12 while asking for 10 • year lifetime. • So increases for FEE/WD are • 10 for TID, 2 for neutrons. • Calculation for SIPM underway FIRST DISK TID=180 krad • Impact of DOSE is large : FPGA, DC-DC converter , ARM suffers @ 20-40 krad. • Wait for refinement of simulation and impact of Crate positions + SHIELDING ? • Is 3 years running + change with spare an option (this is a 3.3 reduction) ? • Measure variations due to low dose and lot changes ? S.Miscetti, MU2E Calorimeter Workshop

  9. Current flowing on SiPMs • There are 3 kinds of contribution that will let some current flow on the detectors • Dose and neutron irradiation damage to the sensors  Increase of Idark • We know that neutrons are the worst case for SiPM. Dose looks negligible. • At end of run, we expect to get each SiPM in the innermost layer to reach • 1 mA current at 0 C  (x 2000 w.r.tinitial start, Idark = 500 nA ) • Assuming 40 months of running  a factor 50 increase/month  • 12/month , 2/week • Average energy deposition from beam-flash at <200 kHz> on crystals • and “fraction” of compton on SiPMs. Assuming second to be smaller  • On innermost layer this corresponds to 30 uA with a factor of 3 safety • The radiation induced noise will create an average “light” in the crystals • and then on SiPMs. Higher source will be DOSE related. • Points to a 3 rad/hours with a factor of 3 safety included. • This is now the highest source of problems. • Assuming G= 0.6 x 10^6, this is 20-40 times larger than point due to average energy. •  it can be as large as 0.6-1 mA if G=0.6x106, Npe/sec =(2-4 )x109/sec!!!! •  Need careful selection of RIN for innermost layer S.Miscetti Introduction @ Mu2eItaly

  10. Average energy deposition @ Micro Bunch (simulation) • Average energy deposition is dominated by beam flash. Second source is DIO? • 130 MeV x 30 pe/MeV x 200 kHz x 1.6 x 10-19 C x GSiPM 500 pe x 200 x 103pe/sec = •  108 pe/sec Ibeam = GSiPM x 1.6 x 10-11 C/sec  16 pC x GSIPM/sec •  16 pA x 0,6 x 10 ^ 6 = 10 uA  Safety simulation x 3  30 uA. S.Miscetti Introduction @ Mu2eItaly

  11. RIN due to DOSE (Caltech) S.Miscetti Introduction @ Mu2eItaly

  12. RIN due to DOSE (LNF) S.Miscetti Introduction @ Mu2eItaly

  13. RIN due to DOSE on SiPMs Npe/sec = 2-4 x 10 9 S.Miscetti Introduction @ Mu2eItaly

  14. TOY: buildup of slow component in subsequent MB Npe/5ns Is it slow component Negligible ?? Miscetti@FDR: night questions

  15. Multiplicity/pileup/event S.Miscetti Introduction @ Mu2eItaly

  16. Uniformity of photon impact on crystal face Aray tracing simulation done with Geant4 , even if the Tyvek optical properties are still not much tuned, shows that the illumination on all the 6 (+6) photosensorsis uniform Miscetti@FDR: night questions

  17. Summary of things to do • Redo simulation of neutrons and dose on SiPM, FEE. Check simulation of neutrons and dose on MB/WD area. Study shielding on top of disk. • Provide Multiplicity test/MB on innermost layer of Disk 1 and other layers  impact on FEE pileup resolving issue + < current> • Study RIN effect on SiPMs • Plan next Dose/neutron campaigns on 2017. • Proceed with prototyping and Module-0 • CABLING and Integration S.Miscetti Introduction @ Mu2eItaly

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