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Charge coupled devices and memories

Charge coupled devices and memories. Charge coupled devices Imaging applications, delay line in signal processing, filters etc. Uses MOS-C Semiconductor Memories Dynamic random access memories (DRAMs) use MOS-C in deep depletion inversion as storage units.

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Charge coupled devices and memories

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  1. Charge coupled devices and memories • Charge coupled devices • Imaging applications, delay line in signal processing, filters etc. • Uses MOS-C • Semiconductor Memories • Dynamic random access memories (DRAMs) use MOS-C in deep depletion inversion as storage units. • We will qualitatively discuss the operation of these devices.

  2. M O S M O S p-Si p-Si VG < 0 VG > 0 Accumulation of holes W QM Depletion of holes MOS-capacitor - review Consider ideal case, with p-type Si VG < 0 accumulation VG > 0; depletion, but less than VT

  3. M O S M O S p-Si p-Si VG>>0 VG>>0 WT QM Depletion of holes Inversion electrons MOS-capacitor - review VG >> 0; VG > VT Steady state inversion condition Depletion layer = WT VG >> 0; VG > VT applied instantaneously. W is larger than WT. W QM After a few ms, you get steady-state condition, and W reduces to WT. Inversion layer forms Depletion of holes

  4. Time required to form inversion layer • It take a few milli-seconds to form the inversion layer since they are caused by minority carriers. Depends on e-h generation rate • can generate faster by optical means • can generate by injection of electrons from n+source and drain if present in close proximity • can increase the temperature to increase e-h generation rate or by introducing deep levels. • In CCDs, e-h pairs are generated by optical means, and generation by thermal means must be kept to a minimum (Why?)

  5. CCD operation region oxide electrons depletion VT Concept of CCD imager • Generation in depletion layer  light intensity • i.e., inversion layer charge  light intensity • Read out of charge pulse amplitude by operating as shift registers • Need to read out sequentially fast enough such that the thermal generation of carriers can be neglected. • 3- clock provides directionality. CG Al VG

  6. Memories • Logic devices that store and manipulate information. • Random access and sequential access. • Semiconductor Memories • non-volatile memory • ROM, PROM, EPROM, E2PROM • Volatile memories • DRAM - need to refresh every few ms. • SRAM - no need to refresh • One transistor DRAM cell • high density, but requires complex read/write/refresh circuits.

  7. One transistor DRAM cell Column bit or data line (BL) Row Word line (WL) CS VP A stored one will be deep depletion condition. A stored zero will be the inversion condition. Note that a stored one will revert to zero if not refreshed. Need refreshing every few milliseconds.

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