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This study explores the electron emission properties of Al2O3 and MgO, highlighting findings from various samples. Notably, the average data for Al2O3 samples showed significant variation under different test conditions, with S1 (5.5nm) and S3 (11.3nm) demonstrating varied results. Meanwhile, MgO samples S5 (7.2nm) and S9 (14.4nm) displayed less variability but performed better at higher primary electron energies. The research indicates that tungsten coating offers minimal benefits. Future work will include further testing of additional samples and improvements in the electron gun system.
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Sample Update (Al2O3 & MgO) S. Jokela, I. Veryovkin, A. Zinovev
Al2O3 S1 – 5.5nm, S3 – 11.3nm
Al2O3 • Selected Data Averaged • However, long-term monitoring or high-fluence electron exposure will determine the final values of these curves. S1 – 5.5nm, S3 – 11.3nm
MgO S5 (left) – 7.2nm, S9 (right) – 14.4nm
MgO • Selected Data Averaged • Not nearly as large of a difference between samples as was seen in the Al2O3 samples. S5 – 7.2nm, S9 – 14.4nm
Overall Comparison • Tungsten coating doesn’t seem to affect results in a significantly helpful way • MgO is clearly a better emitter, especially for higher primary electron energies. • With the amount of variation seen in prior samples, MgO is comparable to Al2O3 for lower primary electron energies.
Future Work • MCP Godparent Review • I have 4 more samples to test (2×Al2O3 and 2×MgO) • Will continue working on system to get electron gun working for large-area, high-fluence, electron exposure. • May have access to thin-film diamond samples