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Advanced ROD Functionality Testing and Debugging Using XROD and TSC Triggers

This document provides an overview of the electrical and functionality tests conducted on the ROD XROD system, utilizing both internal and external TSC triggers. It discusses the capabilities of the ROD FAST debugging tool, access to CMS-like DAQ hardware, and how it integrates with BE boards, TSC, FEC, FED, and CCUM management. Key features include handling CCU6, CCU25, DCU1, DCU2, LLD1, LLD2, and performing optical scan characterization measurements. It highlights noise comparisons between DS.ROD and OTRI along with conclusions based on full gain scans.

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Advanced ROD Functionality Testing and Debugging Using XROD and TSC Triggers

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Presentation Transcript

  1. System control Internal/external TSC triggers

  2. DAQ Software • XROD • System Tests • Electrical and Functionality Tests of RODS

  3. XROD • ROD FAST debugging tool • CMS-like DAQ hardware • Access to BE boards • TSC, FEC, FED, CCUM • Handles CCU6 and CCU25 • Access to FE registers • PLL, MUX, APV, DCU, AOH • Handles DCU1 and DCU2 • Handles LLD1 and LLD2 • Internal/external TSC triggers (and FED internal) • Single GUI Interface

  4. Optical Scan Characterization

  5. Measurements

  6. Noise (DS ROD vs OTRI)

  7. Full Gain Scans (DS ROD)

  8. Noise (DS ROD vs OTRI)

  9. Conclusions (II)

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