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TOB System Test Status Report

TOB System Test Status Report. Juan Valls CERN. DS ROD System Test Setup DAQ Software DS ROD Characterization PLL, FED Timing Scans OPTO Scans Noise Characterization (ROD vs OTRI) Effect of Decoupling Caps on TOB Modules Conclusions . SS ROD System Tests.

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TOB System Test Status Report

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  1. TOB System Test Status Report Juan Valls CERN • DS ROD System Test Setup • DAQ Software • DS ROD Characterization • PLL, FED Timing Scans • OPTO Scans • Noise Characterization (ROD vs OTRI) • Effect of Decoupling Caps on TOB Modules • Conclusions Juan Valls

  2. SS ROD System Tests Conclusions from past TOB system tests Bartalini et al. Chierici et al. • SS ROD electrical design validated • optical readout (6 modules) • electrical controls (electrical FEC, no DOHM) • Grounding scheme found ok and validated • Cooling performance and thermal behavior studied and verified at room temperature • Noise performance studied Overall system performance validated Juan Valls

  3. bottom reset CCU6 SS ROD ICB top BP pulse bottom BP pulse CCU25 DS ROD • New Vienna AOH (LLD2 ICs, 3 laser drivers) • New final CCUM module (CCU25 IC) • Redistribution of resets and back-plane pulses on ROD ICB reset out top reset 6 back-plane pulse lines PIO DCU 2 back-plane pulse lines reset out DS ROD ICB PIO 6 reset lines • New FEC2CCU PCB to mimic DOHM controls functionality (present during the testing of cabled RODs in production) (G. Magazzu, F. Ahmed) Juan Valls

  4. DS ROD • New (prototype) LV PS (Sandor’s design) • DELTA switching power supply (8 V, 50 Amp) (old DELPHI HPC) • Linear regulators (fixed 2.5 V and 1.25 V) • Fast reacting PS (V2.5 overvoltage < 0.2 V, long cables, up to 10 A) • Sense voltages on the regulators for fast feedback • Current limitation on both lines • Interlock controls + V/I monitoring  next version • The CCUM voltages are provided through the FEC2CCUM board DS ROD 12 modules 48 APVs I2.5 (max) ~ 9.2 A I1.25 (max) ~ 3.2 A I2.5 ~ 6.4 A I1.25 ~ 2.6 A ICCU ~ 0.17 A Juan Valls

  5. DS ROD Assembly (Controls) HV adapter card and connector SC out (and LV out) SC in (and LV in) CCUM (with CCU25) LV adapter card and connector ICB Ground Juan Valls

  6. DS ROD Assembly (Readout) 24 fibers New Vienna AOHs (LLD2 ICs) from Jan Troska (Tracker Optical Links Web Page) Juan Valls

  7. DS ROD Setup (Building 598) Optical Readout (~3 m) HV LV C6F14 Cooling Plant FEC2CCUM board TOB DS ROD Layer 1 Electrical Controls 1 kW +5C/+32C Juan Valls

  8. DAQ Software • XROD • System Tests • Electrical and Functionality Tests of RODS • XDAQ • System Tests • Test-Beam • Controls integration Introduces a non-flat CMN picked-up by some of the modules in the ROD (see past talks on SS ROD) • Needed optical control • Separate location of BE boards (FEC card) Simultaneous readout of FED buffers while arrival of input frames Software throttle if FED overflow  inhibit TSC triggers • Subestructure Burnin Test Station (W. Beaumont) Juan Valls

  9. ROD FAST debugging tool CMS-like DAQ hardware Access to BE boards TSC, FEC, FED, CCUM Handles CCU6 and CCU25 Access to FE registers PLL, MUX, APV, DCU, AOH Handles DCU1 and DCU2 Handles LLD1 and LLD2 Internal/external TSC triggers (and FED internal) Single GUI Interface XROD TSC FED APV Juan Valls

  10. XROD Frames • XROD handles up to 3 PMC-FED cards •  8 modules (4 or 8 APVs) • 1 SS ROD (6 modules, 4 or 8 APVs) • 2 SS RODs (4 modules, 4 APVs) • 1 DS ROD (12 modules, 4 APVs) • The use of K-MUX will enhance this capability Noise Gain Scan http://cern.ch/valls/CMS_SST/xrod.htm Pulse Shape Scan Juan Valls

  11. PLL Time Alignment Scan • Scan through PLL fine delays (1.04 ns) and with a fixed FED digitization delay • Reconstruct APV tick marks • The DS ROD introduces shift delays of ~2 ns on the trigger arrival time to APVs. FED 0 FED 1 FED 2 XROD Juan Valls

  12. FED Timing Scan • Find the FED optimal digitization point • Reconstruct APV tick marks by varying FED skew clock delay wrt data (PLL settings fixed) • Choose sampling point close to the back edge of the tick mark FED 0 FED 1 FED 2 XROD Juan Valls

  13. Optical Scan Characterization • Based upon Mirabito’s code • Run FEDs in Scope Mode • Fix AOH settings. Get distribution of ticks and baselines (over events and samples) Inverted ticks into AOH ! (connector mismatch between ICC and AOH PCBs) fixed by patching OEC output connectors Ticks still arriving inverted into the AOH Juan Valls

  14. Optical Scan Characterization • Plot ticks and baselines as a function of bias (for a fixed gain) • Get the tick amplitude from the difference between these distributions AOH Gain = 1 (24 fibers) baselines tick amplitudes ticks AOH bias AOH bias Juan Valls

  15. Optical Scan Characterization • Find optimal settings (gain and bias) for an 800 mV AOH input tick amplitude • What does this correspond to at the FED (in ADC counts)? • Need to calibrate FED cards: FED gain ~3.5 mV/count, Optolink gain ~0.8V/V Gain 0 Gain 1 Gain 2 150-210 counts Gain 0 Gain 1 Gain 2 Bias Juan Valls

  16. Measurements • All measurements taken with: • Optimized timing (PLL, FED) and opto settings (gain and bias) • RMUX = 100  (to match termination with AOHs) • APV bias generator registers (as from “Procedures for Module Test”, Draft 2) • All results given in terms of: • Total noise (tot) • CMN substracted noise (CMN-substracted) • Differential noise (diff)  RMS of ½(ADCi-ADCi+1) Juan Valls

  17. DS ROD Noise Deconvolution Non-Inverting (Doracil) (200 V) Position 2 Position 1 tot Position 3 Position 4 diff CMN ROD ICB Position 6 Cicorel Position 5 CCUM Juan Valls

  18. DS ROD CMN CMN (flat) Calculation (running average pedestals) Non-Inverting Inverting ~40%  Juan Valls

  19. DS ROD HV Scans HV Bias Scan on DS ROD 6 HV channels for 12 modules (CAEN SY-127, A343 boards) Total noise (ADC) = f (Vbias) Full depletion at ~150 Volts Similar behavior for all modules FNAL M658 (Cicorel) placed on top side of ROD (near to CCUM) Juan Valls

  20. FNAL M658 (Cicorel/HybridSA) OTRI Setup Peak Mode Non Inverting Peak Mode Inverting Total Noise (tot) Differential Noise (diff) Deconvolution Non Inverting Deconvolution Non Inverting CMN substracted Noise (CMN-substracted) Juan Valls

  21. Noise (DS ROD vs OTRI) Peak Mode (Non-Inverting) OTRI Cdec tot tot diff diff DS ROD tot diff Deconvolution (Non-Inverting) • DS ROD noisier than OTRI • Slighter higher differential noise than total noise (uncorrelated CMN) Juan Valls

  22. Full Gain Scans (DS ROD) Ical=29 ~ 25000 elec DS ROD Gains/APV Offsets/APV Fit Range: Ical=18 to Ical=70 0.6 – 2.7 MIPs Juan Valls

  23. Full Gain (DS ROD vs OTRI) • OTRI • ROD Peak Mode Non-Inverting Gains (M658) DS ROD vs OTRI (electrons/ADC count) ~850 elec/ADC (OTRI) ~650 elec/ADC (ROD) • ROD • OTRI Deconvolution Non-Inverting Juan Valls

  24. Noise (DS ROD vs OTRI) OTRI Setup Peak: 1600 elec. Dec: 2600 elec. Peak Mode Non-Inverting tot diff DS ROD Setup Peak: 1600 elec. Dec: 2700 elec. tot diff APV25 bare chip on PCB (Cinp=18 pF) Peak: 900 elec. Dec: 1500 elec. Deconvolution Non-Inverting Juan Valls

  25. Effect of Decoupling Cap TOB Cycorel Hybrid Detector Return Decoupling Cdec = 100 nF Edge effect improvement on TIB modules (see Civinini talk) Juan Valls

  26. Edge Strip Correlation Cdec=100 nF OTRI OTRI DS ROD No improvement No edge effect on ROD (w/o Cdec) Juan Valls

  27. TOB/TEC and TIB TOB TIB Vbias   NAIS HV Connector on Kapton Cable   GND Bias Connector on Kapton Cable GND (wirebond to bias ring) Vbias Juan Valls

  28. CMN (DS ROD vs OTRI) Common Mode Noise DS ROD vs OTRI Peak Mode (Non-Inv) OTRI CMN  CMN (Cdec=100 nF) Deconvolution (Non-Inv) DS ROD CMN Juan Valls

  29. Conclusions (I) • Flat noise, flat CMN in both setups • Similar noise results for both setups (OTRI/ ROD) after full gain values applied) • Slightly larger CMN for OTRI than for DS ROD • No evidence of noise edge effects on ROD (optical readout) • Edge effect seen in OTRI setup (FNAL modules M658 and M657, electrical readout), not cured with Cdec • Most of the software tools and hardware designed for the system test setups will also be used during production for electrical and functionality tests of RODs Juan Valls

  30. Conclusions (II) Next... • -source and cosmics studies (see next talk) • Study the cooling performance (thermal behavior) of DS ROD in the cold (with final LV PS + interlocks) • Integration of DOHM (or use of FEC2CCUM) • Exercise >1 RODs in a control loop • Exercise the back-plane pulse functionality • Integration of K-multiplexer into the DAQ • Integration of ROD objects into DB More at... http://cern.ch/valls/CMS_SST/rod_system_tests.htm Juan Valls

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