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Low Power Implementation of Scan Flip-Flops

Low Power Implementation of Scan Flip-Flops. Chris Erickson Graduate Student Department of Electrical and Computer Engineering Auburn University, Auburn, AL 36849 Chris.Erickson@auburn.edu. Objectives. Scan flip-flop overview Ways to incorporate low power design Benchmark circuit Results.

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Low Power Implementation of Scan Flip-Flops

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  1. Low Power Implementation of Scan Flip-Flops Chris Erickson Graduate Student Department of Electrical and Computer Engineering Auburn University, Auburn, AL 36849 Chris.Erickson@auburn.edu

  2. Objectives • Scan flip-flop overview • Ways to incorporate low power design • Benchmark circuit • Results

  3. Scan Flip-Flop Primary outputs Primary inputs Combinational logic Scan-out SO Scan flip- flops D’ D SO D 0 1 Scan enable SE DFF mux D’ SI Scan-in SI SE

  4. How does is work? Primary inputs Primary outputs Combinational logic Scan-out 100 FF=0 FF=0 FF=1 Scan-in 010

  5. SO D 0 1 DFF mux D’ SI SE Low power scan FF cell Low Power Scan Flip-Flop SO D DFF D’ mux SI SE Scan FF cell

  6. Validation of lpsff Q grounds upon entering scan-mode QS provides output to scan chain

  7. Benchmark Circuit • S5378 • 35 Inputs • 49 Outputs • Standard • 179 D-type flip-flops • 1775 Inverters • 239 Or gates • 765 Nor gates • Flattened/optimized • Scan FF • 967 complex gates • Low-Power Scan FF • 1152 complex gates

  8. Primary inputs Primary outputs Combinational logic Scan-out FF FF FF Scan-in Always Random Test Patterns Primary Input Patterns 55 h AA h All 1s All 0s Random but constant 1 Random but constant 2 All Random

  9. Gate Transitions 55h AAh All 1 All 0 Rand 1 Rand 2 All Rand

  10. Gate Events 55h AAh All 1 All 0 Rand 1 Rand 2 All Rand

  11. Average Power Consumption (uW) 55h AAh All 1 All 0 Rand 1 Rand 2 All Rand

  12. Power Reduction sff  lpsff * Only encountered if entering into scan mode and the system didn’t know to latch the input signals.

  13. Conclusion • Low Power Scan Chain can result in up to 35% power reduction. • Minimal 19% area overhead from standard scan chain flip-flop • Average power reduction of 20-30% if input signals are held static

  14. References • TSMC 0.25um process parameters • Mentor Graphics Leonardo for design synthesis • Auburn’s PowerSim3 used for power measurements – Created by : Jins Alexander

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