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Reliability

Reliability. KPOH = Power-On hours for MTBF (thousand) Vmax = Max permitted gate-dielectric voltage without overshoot. Vos = Maximum permitted overshoot voltage when used with a maximum dc level of Vh < Vmax. Reliability for NFET. Temperature = 25ºC Switching Probability to Vh = 50%

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Reliability

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  1. Reliability • KPOH = Power-On hours for MTBF (thousand) • Vmax = Max permitted gate-dielectric voltage without overshoot • Vos = Maximum permitted overshoot voltage when used with a maximum dc level of Vh < Vmax

  2. Reliability for NFET • Temperature = 25ºC • Switching Probability to Vh = 50% • Tos = 50% of a switching cycle • Device Length = 50nm • Temperature = 75ºC • Vmax • Inversely proportional to KPOH • Inversely proportional to log of Device Size

  3. Bias Generator for PVT variation

  4. Layout

  5. Cell Array

  6. Cell Array

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