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Reliability and Safety Analysis

This document presents a comprehensive reliability and safety analysis of the RCD Laser System, focusing on the failure rates and mean time to failure (MTTF) for key components, including the microcontroller, Bluetooth modem, RF receiver, and voltage regulator. Utilization of failure rate equations reveals critical insights into potential system failures, categorized by severity from low to high criticality. The analysis also outlines potential improvements, such as independent monitoring of battery voltage and robust enclosure to enhance overall system safety.

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Reliability and Safety Analysis

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  1. Reliability and Safety Analysis RCD Laser System Corey Lane, Ryan Scott, Danny Barjum

  2. Microcontroller λp = (C1πT + C2πT) πQ πL = 2.36 failures/10^6 hours MTTF = 1/ λ p = .4237e6 hours to failure

  3. Bluetooth Modem λ p = (C1πT + C2πT) πQ πL = 2.45 failures/10^6 hours MTTF = 1/ λ p = .4082e6 hours to failure

  4. RF Reciever λ p = (C1πT + C2πT) πQ πL = 1.226 failures/10^6 hours MTTF = 1/ λ p = .8157e6 hours to failure

  5. Voltage Regulator λ p = λ pπTπSπCπQπE = .3744 failures/10^6 hours MTTF = 1/ λ p = 2.6709e6 hours to failure

  6. Failure Modes – μC Subsystem

  7. Failure Modes – Battery Subsystem

  8. Criticality Definitions • Low Criticality – Inconvenience to the user or failure of system. λp = 10^6 failures/hours • High Criticality – Potential to harm user. λp = 10^9 failures/hour Potential Improvements • Independent monitoring of the battery voltage as a fail safe for the charger. • Robust battery enclosure to reduce critically of battery overcharging. • Monitor voltage regulator and shutdown system if out of range. • Monitor charging power supply voltage and current. • If RF data connection fails, always draw instead of never draw.

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