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Atomic-force-microscope

Strong anti-vibration performance is provided by the combined scan head and sample stage designs used in atomic force microscopes. For more, visit www.labexpo.com

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Atomic-force-microscope

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  1. ATOMIC FORCE MICROSCOPE 43-ATM101 www.labexpo.com info@labexpo.com |

  2. ATOMIC FORCE MICROSCOPE 43-ATM101 Atomic force microscope comes with combined design of scan head and sample stage, to give strong anti-vibration performance. Adopted with servomotor, drives the sample approaching tip manually or automatically, to evaluate precise scanning area position. Equipped with precision laser detection and probe alignment device, make easy adjustment of laser beam. FEATURES ◇ Large sample transfer range ◇ Optical observation system for checking tip & sample’s position ◇ Modular electronic system for easy maintenance ◇ CCD observing system ◇ Equipped with servomotor to achieve CCD auto focusing ◇ Provides highly accurate results

  3. SPECIFICATIONS Operation modes Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scan angle 0 to 360° 0 to 360° X/Y axis: 50 µm, Z axis: 5 µm Magnification: 10x, Resolution: 1 µm X/Y axis: 0.2 nm, Z axis: 0.05 nm Ø≤ 90 mm, H≤ 20 mm 0 to 20 mm 10 ± 2 ms 0.6 Hz to 4.34 Hz XY: 18 bit D/A & double 16 bit A/D multiple channel simultaneously 256×256, 512×512 DSP digital feedback 64 KHz USB 2.0 Compatible with windows 98/2000/XP/7/8 700 × 500 × 460 mm 50 kg 87.4 kg Scan angle Maximum scan range Optical system/ Magnification of CCD Resolution Sample size Sample movement Pulse width of approaching motor Scan rate Scanning control Types of sampling pixel Feedback type Feedback sampling rate PC connections: Windows software Instrument Diemnsion Net weight Gross Weight APPLICATIONS It finds best solution for applications in biochemistry for tissues, cells, cellular components imaging, nanotechnology for imaging of polymers, nanomaterials, and in chemistry physics for imaging of surface metals elements.

  4. SOFTWARE FEATURES Captures & display multi-channel images at same time, observes profile map in real- time Measures multiple curves like F-Z, F-RMS, RMS-Z 3 Execute move & cut functions of scan area, selects an area of interest Scans sample in 0to 360° angle range Adjust laser spot detection system in real time Selection and setting for different color scanning images in palette Supports linear average and offset calibration in real time for sample title Supports scanner sensitivity calibration and electronic controller auto-calibration Supports offline analysis and process of sample image Lab Expo Ltd. Lab Expo Corporation, 200 Continental Drive Newark, Delaware 19713 USA Email: info@labexpo.com Website: www.labexpo.com Phone: +1 403 879 9521 | | Catalog Generated On : 12/10/2022

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