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Irradiation Test of the Virtex-5 Muon Port Card Mezzanine

Irradiation Test of the Virtex-5 Muon Port Card Mezzanine. Devices Under Test. XC5VLX110 FPGA. XCF128X PROM. Firmware for the Irradiation Test. ■ Two pipeline chains, 16-bit wide and 10,000 (10) steps deep ■ Pseudo-Random Bit Stream Generators as data sources

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Irradiation Test of the Virtex-5 Muon Port Card Mezzanine

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  1. Irradiation Test of the Virtex-5 Muon Port Card Mezzanine Devices Under Test XC5VLX110 FPGA XCF128X PROM

  2. Firmware for the Irradiation Test ■ Two pipeline chains, 16-bit wide and 10,000 (10) steps deep ■ Pseudo-Random Bit Stream Generators as data sources ■ Only the Configurable Logic Blocks (CLB) and Flip-flops (FF) are used (close to realistic MPC firmware), running at 40MHz ■ Common reset ■ Error signal is counted externally by Agilent 53132A counter ■ LVDS link (~8 m long) between the MPC residing in the irradiation area and the laptop/counter in the control room ● 4 JTAG lines ● Error signal ● Hard reset to reload the FPGA from EPROM

  3. MPC Under Beam

  4. Xilinx XC5VLX110-1FF1153C FPGA Test 1 ■ Irradiated for 75 minutes with the firmware ver 1 (long pipeline = 104) ● Effective fluence 2.421*1010 ions/cm2 ● Average flux 5.517*106 ions/cm2/s ● Dose 3.6 kRad ■ Observed ~300 SEU of three types: ● Counter counts +1 (most errors) - Bit flip in the pipeline chain; self recoverable ● Counter counts continuously (5 times) ● Counter counts to some large number (for example, 3720) and then freezes (9 times) - Pipeline chain or reset circuitry broken… need to reload FPGA from EPROM ■ 5 to 15 seconds between SEU, more frequent with higher flux, which varied from ~3*106 to ~7*106 ions/cm2/sin this run ■ Average dose to get an error is ~12 rad. With the average flux of 5.5*106 ions/cm2/s or 107 protons/cm2/s, the cross section of SEU is ~10-8 cm2 per device. ■ Assuming 10-year fluence of ~1011 neutrons per cm2 [1] at full LHC design luminosity, the worst case SEU rate would be 10-8 cm2 x 1011 neutrons/cm2 / 108 sec = 10-5, or 1 SEU in ~ 30 hours [1] http://cmsdoc.cern.ch/~huu/tut1.pdf

  5. Xilinx XC5VLX110-1FF1153C FPGA Test 2 ■ Irradiated for 20 minutes with the firmware ver 2 (short pipeline = 10) ● Effective fluence 5.815*109 ions/cm2 ● Average flux 4.741*106 ions/cm2/s ● Dose 865 Rad ■ No SEU of any type observed

  6. Xilinx XCF128X EPROM Test ■ Irradiated for 70 minutes with the firmware ver 1 (long pipeline) ● Effective fluence 6.120*1010 ions/cm2 ● Average flux 5.517*106 ions/cm2/s ● Dose 3.7 kRad ■ Read back the EPROM via JTAG periodically, then compared with the original configuration file ■ Not a single SEU, as expected ■ The beam we had at TAMU cyclotron is not very good for a TID study (for example: need 5..6 hours to get 20 kRad)

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