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CIRCUIT PROTECTION SOLUTIONS. ESD Protection for USB 3.0 Ports. USB3.0 Protection Using TVS Diode Arrays (SPA TM ) Two Device Solution. Two Device Solution for USB3.0 Protection -ESD solutions are silicon-based for lowest possible clamping voltage . USB Port. USB Controller. V BUS.
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CIRCUIT PROTECTION SOLUTIONS ESD Protection for USB 3.0 Ports
USB3.0 Protection Using TVS Diode Arrays (SPATM) Two Device Solution
Two Device Solution for USB3.0 Protection -ESD solutions are silicon-based for lowest possible clamping voltage USB Port USB Controller VBUS D+ D- SP3003 Optional Outside World NC IC SSTX+ SSTX- GND SP3010 SSRX+ SSRX- *Package is shown as transparent Case GND Signal GND SP3003-02XTG - 0.65pF, 2 channels - 1.6mm x 1.6mm SP3010-04UTG - 0.45pF, 4 channels - 2.5mm x 1.0mm
ESD Protection of Super Speed Data Lines -SP3010-04UTG; silicon-based technology -Capacitance value of 0.45pF Key feature of the silicon technology: - Low dynamic resistance - Allows SPA product to have low clamping voltage
USB3.0 Protection Using TVS Diode Arrays (SPATM) Fully Integrated Solution
Fully Integrated Solution for ESD Protection -Silicon-based for lowest possible clamping voltage -Protection on all data lines is 0.40pF diodes USB Port USB Controller VBUS SSTX+ SSTX- Outside World IC SSRX+ SSRX- GND SP3011 D+ D- *Package is shown as transparent Case GND Signal GND SP3011-06UTG - 0.40pF, 6 channels - 3.5mm x 1.35mm
SP3011-06UTG -Six-channel solution to protect all data lines in USB 3.0 port -Uses same straight-through pin out to simplify board design Key feature of the silicon technology: - Low dynamic resistance - Allows SPA product to have low clamping voltage
Signal Integrity Test Boards -Verifying Eye Diagrams with 5Gbps data rates USB Connector • ESD Device • SP3011-06UTG USB Connector
Test Setup -Board shown without the SP3011-06UTG
Eye Diagram -Results without the SP3011-06UTG -PASS
Eye Diagram -Results with the SP3011-06UTG -PASS
Summary - USB3.0 Protection using Littelfuse TVS Diode Arrays (SPATM) • Littelfuse has two protection schemes for a USB 3.0 port • SP3010-04UTG & SP3003-02XTG • SP3011-06UTG • Eye diagram testing at 5Gbps proves compatibility with the Super Speed environment • Silicon technology offers the lowest clamping voltage compared to competing technologies due to it’s lower dynamic resistance • For more on USB3.0 Protection please read our white paper online at: • http://www.littelfuse.com/data/en/Application_Notes/Littelfuse-USB-3-ESD-Protection.pdf